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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Pommerenke, David
Graz University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (10/10 displayed)
- 2023On the Difficulties to Determine the Intrinsic Material Parameters for MnZn Ferritescitations
- 2023The distribution of discharge amplitudes of randomly colliding charged spherescitations
- 2023A Method to Determine the Permittivity of Anisotropic Thin Sheet Absorber Materials
- 2018Characterization of relative complex permittivity and permeability for magneto-dielectric sheetscitations
- 2018Measurement of Dielectric Constant and Cross-Sectional Variations of a Wirecitations
- 2018Common-mode impedance of a ferrite toroid on a cable harness
- 2012Nonlinear capacitors for ESD protectioncitations
- 2011Rapid rotary scanner and portable coherent wideband Q-band transceiver for high-resolution millimeter-wave imaging applicationscitations
- 2002Efficient FDTD simulation of fields in coaxial cables with multi-layered insulation partially formed by dispersive layers of extremely high permittivitycitations
- 2000Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables
Places of action
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article
Broadband measurement of the conductivity and the permittivity of semiconducting materials in high voltage XLPE cables
Abstract
<p>The measurement of frequency dependent conductivity and permittivity in semiconducting materials was investigated in the high-voltage cross-linked polyethylene (XLPE) cables. The measurement set up was studied in order to determine the reflection coefficients. The semiconductor sample was analyzed in terms of impedance, calibration, accuracy and temperature control. The temperature dependence of these semiconducting layers of medium and high voltage cables was also reported.</p>