| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Grogger, Werner
Graz University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (11/11 displayed)
- 2024Three-dimensional distribution of individual atoms in the channels of beryl
- 2024Three-dimensional distribution of individual atoms in the channels of berylcitations
- 2024Phase Transitions and Ion Transport in Lithium Iron Phosphate by Atomic‐Scale Analysis to Elucidate Insertion and Extraction Processes in Li‐Ion Batteriescitations
- 20232D and 3D STEM Imaging and Spectroscopy: Applications and Perspectives in View of Novel STEM Infrastructure
- 2023Phase analysis of (Li)FePO4 by selected area electron diffraction and integrated differential phase contrast imaging
- 2022Phase Analysis of (Li)FePO4 by Selected Area Electron Diffraction in Transmission Electron Microscopy
- 2022Quantifying Ordering Phenomena at the Atomic Scale in Rare Earth Oxide Ceramics via EELS Elemental Mapping
- 2022Challenges in the characterization of complex nanomaterials with analytical STEM
- 2021Spectroscopic STEM imaging in 2D and 3D
- 2018Intermetallic Compound and Void Kinetics Extraction From Resistance Evolution in Copper Pillars During Electromigration Stress Testscitations
- 2002Quantitative measurement of Cr segregation in Co0.8-xCr xPt0.1B0.1 recording media by scatter diagram analysiscitations
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document
Three-dimensional distribution of individual atoms in the channels of beryl
Abstract
Nanoporous materials constitute a diverse group with numerous applications, including gas<br/>storage and separation, catalysis, sensors, and electrochemical energy conversion and<br/>storage [1]. Understanding the fundamental mechanisms of diffusion and adsorption of<br/>atomic and molecular species within the pores of this class of materials is, therefore,<br/>paramount. While the localization of single atoms in crystalline materials has been<br/>demonstrated using high resolution TEM based techniques [2], the high susceptibility of most<br/>nanoporous specimen to the electron beam presents significant challenges for quantitative<br/>high-resolution investigations of these materials [3]. Here, we present our results on the<br/>quantitative analysis of single atoms adsorbed within the channels of beryl (Be2AlSi6O18).<br/>Through statistical analysis of the atomic column intensities and comparison with multiple<br/>series of multislice simulations, we determine the local thickness of the specimen, as well as<br/>the three-dimensional position of single adsorbed Cs atoms within the channels, based on a<br/>single STEM high-angle annular dark-field (HAADF) image. Extracting all necessary<br/>information from a single highresolution micrograph, enables us to minimize beam damage effects, offering a promising methodology also for the analysis of other porous<br/>materials [4].