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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Dudonis, Julius
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (8/8 displayed)
- 2011Scandium stabilized zirconium thin films formation by e-beam techniquecitations
- 2011The properties of scandium and cerium stabilized zirconium thin films formed by e-beam techniquecitations
- 2011Synthesis and characterization of GDC solid electrolytes obtained by solid state sintering of multilayer thin filmscitations
- 2011Influence of initial powder particle size on yttrium stabilized zirconium thin films formed by e-beam techniquecitations
- 2010The properties of gadolinium doped cerium oxide thin films formed evaporating nanopowder ceramic
- 2010Synthesis of gadolinium doped ceria solid electrolyte by solid state reactions of CeO2/Gd2O3 multilayer thin films
- 2009The properties of samarium doped ceria oxide thin films grown by e-beam deposition techniquecitations
- 2007Formation of gadolinium doped ceria oxide thin films by electron beam deposition
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article
Formation of gadolinium doped ceria oxide thin films by electron beam deposition
Abstract
Gadolinium doped ceria oxide (GDC) thin films were grown evaporating (Ce0.9Gd0.1)O1.95 ceramic powder by using e-beam deposition technique. Operating technical parameters that influence thin film properties were studied. The GDC thin films (2 µm – 3 µm of thickness) were deposited on two different types of substrates: porous NiO-YSZ (nickel oxide – yttrium stabilized zirconium) and Alloy 600 (Fe-Ni-Cr). The influence of electron gun power on thin film structure and surface morphology were investigated by X-ray diffraction and scanning electron microscopy. It was found that electron gun power (changed in the range of 0.66 kW – 1.05 kW) has the influence on the crystallite size (it varied between 7.6 nm – 14.3 nm) of GDC thin films and decreased linearly increasing e-beam gun power.