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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Renaud, Gilles
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (17/17 displayed)
- 2024In situ characterisation of graphene growth on liquid copper-gallium alloys: Paving the path for cost-effective synthesiscitations
- 2024Operando characterization and molecular simulations reveal the growth kinetics of graphene on liquid copper during chemical vapor depositioncitations
- 2024Operando Characterization and Molecular Simulations Reveal the Growth Kinetics of Graphene on Liquid Copper During Chemical Vapor Depositioncitations
- 2022Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double crystal deflector
- 2022In situ resonant x-ray scattering at the French “CRG-IF” beamline at ESRF
- 2022In situ resonant x-ray scattering at the French “CRG-IF” beamline at ESRF
- 2020Al-rich Fe0.85 Al0.15 (100), (110) and (111) surface structurescitations
- 2019Room Temperature Commensurate Charge Density Wave in Epitaxial Strained TiTe 2 Multilayer Filmscitations
- 2016Temperature evolution of defects and atomic ordering in Si1-xGex islands on Si(001)citations
- 2015The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowirescitations
- 2015The In situ growth of Nanostructures on Surfaces (INS) endstation of the ESRF BM32 beamline: a combined UHV–CVD and MBE reactor for in situ X-ray scattering investigations of growing nanoparticles and semiconductor nanowirescitations
- 2013Strains Induced by Point Defects in Graphene on a Metalcitations
- 2013Strains Induced by Point Defects in Graphene on a Metalcitations
- 2012Epitaxial orientation changes in a dewetting gold film on Si(111).citations
- 2011Tracking defect type and strain relaxation in patterned Ge/Si(001) islands by x-ray forbidden reflection analysiscitations
- 2010Substrate-enhanced supercooling in AuSi eutectic dropletscitations
- 2008Growth of Co on Au(111) studied by multiwavelength anomalous grazing-incidence small-angle x-ray scattering: From ordered nanostructures to percolated thin films and nanopillarscitations
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document
In situ resonant x-ray scattering at the French “CRG-IF” beamline at ESRF
Abstract
We show two examples of resonant x-ray scattering experiments performed in situ on the INS2 end-station of the BM32 beamline at ESRF. In the first one the inversion parameter of thin cobalt ferrite films grown on Ag(001) by oxygen-assisted MBE is found. In spinel structure this parameter quantifies the distribution of divalent and trivalent cations on tetrahedral and octahedral sites, and strongly influence the electronic and magnetic properties of the ferrite. By measuring grazing incidence resonant x-ray diffraction intensity versus energy of several spinel peaks at the iron and cobalt K-edges and comparing with theoretical calculations performed with the FDMNES code, we could find that cobalt occupies mostly octahedral sites, resulting in an inversion parameter of 0.88(5). 1 In the second experiment we studied Co-Pt nanoparticles self-organized on an ultrathin aluminum oxide film on Ni3Al(111), a template with a 4.1 nm hexagonal surface lattice. Co and Pt were subsequently deposited on the template layer seeded with a few Pd atoms per unit cell. Bimetallic nanoparticles organize at the corners of the oxide hexagonal surface cell giving sharp peaks in the small angle x-ray scattering pattern. The analysis of the RXD measured at the cobalt K edge on these SAXS features evidences then a core-shell structure. GISAXS of 0.15 nm Co on alumina template (Pd seeded), and RXD of the (10) reflection (Co K edge). These examples demonstrate the capabilities of BM32 for in situ resonant scattering studies. At short term, they will be improved with the installation of a crystal analyser.