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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Sathyamoorthy, R.
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Publications (8/8 displayed)
- 2011Dielectric and relaxation properties of thermally evaporated nanostructured bismuth sulfide thin filmscitations
- 2009High-energy heavy-ion induced physical and surface-chemical modifications in polycrystalline cadmium sulfide thin filmscitations
- 2008Influence of porous morphology on optical dispersion properties of template free mesoporous titanium dioxide (TiO2) filmscitations
- 2007Effect of 80 MeV oxygen ion beam irradiation on the properties of CdTe thin filmscitations
- 2007Swift heavy ion beam irradiation induced modifications in structural, morphological and optical properties of CdS thin filmscitations
- 2006Structural properties of CdTe thin films on different substrates
- 2006Structural and photoluminescence properties of swift heavy ion irradiated CdS thin filmscitations
- 2003Structural, Optical and Electrical Properties of Zinc Phthalocyanine (ZnPc) thin films
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Structural, Optical and Electrical Properties of Zinc Phthalocyanine (ZnPc) thin films
Abstract
In this article, we have reported the structural, optical and electrical properties of ZnPc thin films. The samples were prepared by thermal evaporation method. The thickness of the samples were measured by the quartz crystal monitor. The structural analysis were carried out by X-ray diffraction (XRD) and Scanning Electron Microscope (SEM). The XRD studies and SEM studies of the ZnPc thin films are reveals that the films are amorphous in nature. The optical properties in the transmission mode have studied by spectrophotometer in the visible region. The possible transition in these films is found to be direct and allowed. AC conduction mechanism and dielectric properties in these films (Al-ZnPc-Al structure) were studied by the LCR meter for various frequencies (12 Hz to 100 KHz) at different temperatures. The field dependence behaviour on activation energy and possible conduction mechanism in the ZnPc films under dc field have also been discussed.