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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Nikzad, Shouleh
in Cooperation with on an Cooperation-Score of 37%
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Publications (7/7 displayed)
- 2023Quantum Efficiency Measurement for UV Detector Development
- 2018Ultrathin protective coatings by atomic layer engineering for far ultraviolet aluminum mirrorscitations
- 2017Enhanced atomic layer etching of native aluminum oxide for ultraviolet optical applicationscitations
- 2017Atomic layer deposition and etching methods for far ultraviolet aluminum mirrorscitations
- 2016Performance and prospects of far ultraviolet aluminum mirrors protected by atomic layer depositioncitations
- 2016Atomic Layer Deposited (ALD) coatings for future astronomical telescopes: recent developmentscitations
- 2014Recent developments and results of new ultraviolet reflective mirror coatingscitations
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document
Quantum Efficiency Measurement for UV Detector Development
Abstract
UV photon detection is infamously difficult with silicon CCDs, due in part to shallow absorption depths in Si semiconductors, typical surface defects, and absorption by front surface circuitry. Only recently have new developments in coatings and surface passivation (i.e. Delta-doping) helped make CCDs a competitive option for UV astronomy. Our lab at Steward Observatory is currently using a customized UV-Vis monochromator to characterize the efficacy of these technologies. We use a McPherson 207V Monochromator with collimator and deuterium and xenon lamp sources to measure the spectral response of our detectors. With this setup we can measure detector throughput across an effective range of ~150-700 nm in wavelength, with sub-nanometer spectral resolution allowing for precise measurement of a detector's spectral response. Our lab is currently working on testing e2v's 201-20 EMCCD that are both delta-doped and given an anti-reflection (AR) coating by collaborators at JPL. Here we provide information on our test setup and testing process as well as preliminary results for our experiment with these coatings....