Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023Quantum Efficiency Measurement for UV Detector Developmentcitations

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Chart of shared publication
Shirmanesh, Ghazaleh
1 / 1 shared
Nikzad, Shouleh
1 / 7 shared
Jewell, April
1 / 1 shared
Khan, Aafaque
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Cheng, Sam
1 / 1 shared
Jones, Todd
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Jones, Olivia
1 / 3 shared
Kerkeser, Nazende
1 / 1 shared
Hamden, Erika
1 / 1 shared
Bradley, Harrison
1 / 1 shared
Chart of publication period
2023

Co-Authors (by relevance)

  • Shirmanesh, Ghazaleh
  • Nikzad, Shouleh
  • Jewell, April
  • Khan, Aafaque
  • Cheng, Sam
  • Jones, Todd
  • Jones, Olivia
  • Kerkeser, Nazende
  • Hamden, Erika
  • Bradley, Harrison
OrganizationsLocationPeople

document

Quantum Efficiency Measurement for UV Detector Development

  • Shirmanesh, Ghazaleh
  • Kyne, Gillian
  • Nikzad, Shouleh
  • Jewell, April
  • Khan, Aafaque
  • Cheng, Sam
  • Jones, Todd
  • Jones, Olivia
  • Kerkeser, Nazende
  • Hamden, Erika
  • Bradley, Harrison
Abstract

UV photon detection is infamously difficult with silicon CCDs, due in part to shallow absorption depths in Si semiconductors, typical surface defects, and absorption by front surface circuitry. Only recently have new developments in coatings and surface passivation (i.e. Delta-doping) helped make CCDs a competitive option for UV astronomy. Our lab at Steward Observatory is currently using a customized UV-Vis monochromator to characterize the efficacy of these technologies. We use a McPherson 207V Monochromator with collimator and deuterium and xenon lamp sources to measure the spectral response of our detectors. With this setup we can measure detector throughput across an effective range of ~150-700 nm in wavelength, with sub-nanometer spectral resolution allowing for precise measurement of a detector's spectral response. Our lab is currently working on testing e2v's 201-20 EMCCD that are both delta-doped and given an anti-reflection (AR) coating by collaborators at JPL. Here we provide information on our test setup and testing process as well as preliminary results for our experiment with these coatings....

Topics
  • impedance spectroscopy
  • surface
  • experiment
  • semiconductor
  • Silicon
  • defect