Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Keckes, Julius

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Erich Schmid Institute of Materials Science

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2024Exploring Refinement Characteristics in FeTi‐Cu x Composites: A Study of Localization and Abrasion Constraints1citations
  • 2023Mapping strain across Co80Ta7B13 / Co62Ta6B32 glassy interfacescitations
  • 2022Probing local atomic strain of metallic glasses with nanometer resolution using TEM diffraction mappingcitations
  • 2016Cross-sectional structure-property relationship in a graded nanocrystalline Ti1-xAlxN thin film36citations

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Eckert, Jürgen
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Spieckermann, Florian
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Zalesak, J.
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Co-Authors (by relevance)

  • Eckert, Jürgen
  • Spieckermann, Florian
  • Kiener, Daniel
  • Buchebner, Nadine
  • Schweiger, Lukas
  • Jansen, H. C.
  • Evertz, S.
  • Gammer, C.
  • Zalesak, Jakub
  • Hans, Marcus
  • Sheng, Huaping
  • Mayrhofer, P. H.
  • Mitterer, Christian
  • Krywka, C.
  • Daniel, Rostislav
  • Zalesak, J.
  • Bartosik, M.
OrganizationsLocationPeople

document

Probing local atomic strain of metallic glasses with nanometer resolution using TEM diffraction mapping

  • Keckes, Julius
Abstract

This thesis elucidates the characterization of metallic glasses (MGs) by means of scanning nanobeam electron diffraction (NBED) mapping, also known as four-dimensional scanning transmission electron microscopy (4D STEM), using precession electron diffraction (PED). An emphasis lies on the evaluation of nanodiffraction datasets through fitting of a parametric ellipse equation, which enables two-dimensional determination of local elastic strains, as well as structural and compositional characterization at the nanoscale. An insight is given into the implementation of the fitting procedure, as well as dataset acquisition and subsequent data processing steps. A study is conducted on a Cu-Zr-Al bulk-metallic-glass (BMG) alloy, to determine optimal experimental parameters and a suitable evaluation approach. The results demonstrate the potential of mapping intrinsic structural heterogeneities in metallic glasses (MGs). The method is applied to a multilayered Co-Ta-B MG thin film system, demonstrating a spatial resolution of a few nanometres for the determination of elastic strains, as well as structural and compositional characterization. The results also provide unique insight into strain distribution and structure at amorphous interfaces. Additionally, an in-situ nanomechanical testing experiment is conducted on a Cu-Zr-Al BMG bending beam, during which 4D STEM strain mapping datasets are acquired. The subsequent evaluation allows the quantification of local multiaxial elastic strain distributions, occurring at different bending loads, which indicate an evolution of the stress concentrations at the beam notch position. The unprecedented resolution with which local elastic strains, structure and composition of MGs can be characterized, enables opportunities for material optimization, such as the quantitative comparison of obtained results to simulations.

Topics
  • impedance spectroscopy
  • amorphous
  • experiment
  • thin film
  • simulation
  • electron diffraction
  • glass
  • glass
  • transmission electron microscopy
  • two-dimensional