| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Smet, Philippe
Ghent University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (16/16 displayed)
- 2023Glass-based composites comprised of CaWO4:Yb3+, Tm3+ crystals and SrAl2O4:Eu2+, Dy3+ phosphors for green afterglow after NIR chargingcitations
- 2022Near-infrared rechargeable glass-based composites for green persistent luminescencecitations
- 2022An in situ photoluminescence study of atomic layer deposition on polymer embedded InP-based quantum dots
- 2021Young's modulus of thin SmS films measured by nanoindentation and laser acoustic wavecitations
- 2021A full thermal model for acoustically induced (thermo)luminescence
- 2021Atomic layer deposition on polymer thin films : on the role of precursor infiltration and reactivitycitations
- 2019SmS/EuS/SmS tri-layer thin films : the role of diffusion in the pressure triggered semiconductor-metal transitioncitations
- 2016Seeing (ultra)sound in real-time through the Acousto-PiezoLuminescent lens
- 2015Lanthanide-assisted deposition of strongly electro-optic PZT thin films on silicon: toward integrated active nanophotonic devicescitations
- 2013Preferentially oriented BaTiO3 thin films deposited on silicon with thin intermediate buffer layerscitations
- 2013Cs7Nd11(SeO3)(12)Cl-16: first noncentrosymmetric structure among alkaline-metal lanthanide selenite halidescitations
- 2013Combining optical and electrical studies to unravel the effect of Sb doping on CIGS solar cell
- 2012The configuration of rare earth centers in nitridosilicates: an x-ray absorption and optical investigation
- 2008Cathodoluminescence mapping with an energy-dispersive x-ray detector: principle, simulation and application
- 2008Synthesis and photoluminescence characteristics of Al2O3 thin films doped with (Ca,Sr)S:Eu2+
- 2008Cathodoluminescence mapping with an EDX detector: principle, simulation and application
Places of action
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document
Cathodoluminescence mapping with an EDX detector: principle, simulation and application
Abstract
The observation of cathodoluminescent (CL) emission in a scanning electron microscope (SEM) generally offers a wealth of information as it allows the study of materials on a nanoscale, thus separating effects which are disguised in macroscopic luminescence measurements. In combination with elemental analysis (e.g. EDX) or with structural analysis (e.g. EBSD), even more information can be extracted [1,2].Here we report on the use of the silicon detector, normally used for the energy-dispersive analysis of the characteristic x-rays, for the detection of (CL) light [3]. When visible light is absorbed by this detector, electron-hole pairs are generated which introduce a spurious signal in the low-energy part of the EDX spectrum. The intensity of this signal was studied as a function of the detector settings and the wavelength and intensity of the incoming light. This behaviour was then explained based on the working principle of the EDX setup and confirmed by numerical simulations with a purposely written software program. Although the detection of CL with the EDX detector can be a nuisance for elemental analysis, we show that the signal in the low-energy part of the EDX spectrum can readily be used to obtain CL mappings along with simultaneously recorded elemental mappings.We illustrate this CL mapping technique with experiments on both thin films and powders. The hydrolysis behaviour of blue-emitting BaAl2S4:Eu2+ thin films, which are used in flat panel electroluminescent displays, was studied. For several powder phosphors (Ca2SiS4:Eu2+, SrAl2O4:Eu2+,...) elemental analysis with EDX was readily correlated with the CL emission mappings. In all cases, the CL emission was also observed with a conventional CL setup using a CCD to check the validity of the CL mapping with the EDX detector.In conclusion, we explained and simulated why an EDX detector can be used for panchromatic CL mappings. The main advantage is that no additional software or hardware is required to obtain the mappings. Furthermore, this method allows mapping of the CL on samples with strong and inhomogeneous electric charging as a repeated, fast scanning of the sample surface can be used.