Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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University of Rennes

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023Optical characterizations of epitaxial materials: from crystal defects to optoelectronic propertiescitations

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Léger, Yoan
1 / 31 shared
Cornet, Charles
1 / 61 shared
Chart of publication period
2023

Co-Authors (by relevance)

  • Léger, Yoan
  • Cornet, Charles
OrganizationsLocationPeople

conferencepaper

Optical characterizations of epitaxial materials: from crystal defects to optoelectronic properties

  • Léger, Yoan
  • Huillery, Paul
  • Cornet, Charles
Abstract

Materials for light harvesting or photonic applications are at the heart of many recent technological developments and innovation, to address the main issues of the XXIst century, such as health care, clean water, sanitation, affordable and clean energy, environmental sensors, climate action, computing or communication. In this context, epitaxy is often considered as the ultimate technology for growing materials with dedicated physical properties, and especially optical ones. It however comes with the inevitable formation of several different crystal defects. In this contribution, the link between crystal defects and optoelectronic properties of semiconductors will be first presented. We will then review the different optical characterization tools commonly used with epitaxial materials, both for light emission or light harvesting. Prospects will be given on the development of single photons characterization tools, in the context of the recent development of quantum technologies.

Topics
  • impedance spectroscopy
  • semiconductor
  • mass spectrometry
  • defect