| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Hilgenkamp, Hans
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2024The effect of intrinsic magnetic order on electrochemical water splittingcitations
- 2024Imaging the suppression of ferromagnetism in LaMnO3 by metallic overlayerscitations
- 2023Imaging selective magnetic patterning of Ti/LaMnO3/SrTiO3 heterostructures using scanning SQUID microscopy
- 2023Paramagnetic Nd sublattice and thickness-dependent ferromagnetism in Nd2NiMnO6 double perovskite thin filmscitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Studycitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets: a Combined Microscopy, Diffraction, Transport, and Soft X‐Ray in Transmission Studycitations
- 2020Structure and magnetic properties of epitaxial CaFe2O4 thin filmscitations
- 2020Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Materialcitations
- 2020MoRe/YBCO Josephson junctions and π-loopscitations
- 2020Tailoring Vanadium Dioxide Film Orientation Using Nanosheets : a Combined Microscopy, Diffraction, Transport, and Soft X-Ray in Transmission Studycitations
- 2019Electrochemical metallization ReRAMs (ECM) - Experiments and modellingcitations
- 2007Magnetic effects at the interface between non-magnetic oxidescitations
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document
Imaging selective magnetic patterning of Ti/LaMnO3/SrTiO3 heterostructures using scanning SQUID microscopy
Abstract
In its bulk LaMnO<sub>3</sub> (LMO) is an antiferromagnetic material, however thin films deposited on SrTiO<sub>3</sub> (STO) substrates show ferromagnetism with a Curie temperature at 115 K [1]. Previous work from our group [2] has shown that there exists a critical thickness of 6 unit cells for LMO/STO heterostructures below which antiferromagnetism is recovered. This re-emergence has been clearly imaged using scanning SQUID microscopy (SSM), which is a powerful technique to image local magnetic flux by scanning a SQUID chip with micrometer scale resolution across the surface [3].<br/>In this work we report the use of SSM to image the suppression of ferromagnetism by patterned Ti oxygen scavenging layers. A thin (~4nm) Ti layer covering a 20 unit cell LMO layer can completely suppress the magnetic signal emerging from the LMO layer. This suppression can be directly imaged using SSM where a clear reduction in stray magnetic field is measured for Ti covered LMO as opposed to uncovered regions. A possible reason for this reduction in ferromagnetism can be attributed to oxygen scavenging by the Ti layer, which mediate the indirect exchange processes that lead to ferromagnetism.<br/>Furthermore, by selective patterning of Ti structures it is possible to effectively pattern the ferromagnetism down to the nanoscale. At structure sizes near 5 µm dipole-like magnetic signals are measured, typical of single ferromagnetic domains with an in-plane orientation. By introducing anisotropy in the patterned structures the dipole signals can be aligned and possibly interactions between them can be manipulated. This shows potential for control of ferromagnetism for applications in oxide electronics and spintronics. <br/>The study also nicely exemplifies the power and potential of scanning SQUID microscopy to locally image magnetic signals, and our further developments on this will be discussed as well.<br/><br/>[1] Gupta et al. Applied Physics Letters 67: 3494-3496 (1995)<br/>[2] Wang et al. Science 349: 716-719 (2015)<br/>[3] Reith et al. Review of Scientific Instruments 88: 123706 (2017)<br/>