Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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1.080 Topics available

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693.932 PEOPLE
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Show results for 693.932 people that are selected by your search filters.

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Naji, M.
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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (10/10 displayed)

  • 2023New insight into degradation mechanisms of conductive and thermally resistant polyaniline films6citations
  • 2023Comparison of Tiling Artifact Removal Methods in Secondary Ion Mass Spectrometry Images1citations
  • 2023Two-Dimensional and Three-Dimensional Time-of-Flight Secondary Ion Mass Spectrometry Image Feature Extraction Using a Spatially Aware Convolutional Autoencoder15citations
  • 2023Exploring the Relationship between Polymer Surface Chemistry and Bacterial Attachment Using ToF‐SIMS and Self‐Organizing maps8citations
  • 2022Applications of multivariate analysis and unsupervised machine learning to ToF-SIMS images of organic, bioorganic, and biological systemscitations
  • 2020ToF-SIMS and machine learning for single-pixel molecular discrimination of an acrylate polymer microarraycitations
  • 2020Analyzing 3D Hyperspectral ToF-SIMS Depth Profile Data Using Self-Organizing Map-Relational Perspective Mapping17citations
  • 2018Distinguishing chemically similar polyamide materials with ToF-SIMS using self-organizing maps and a universal data matrix24citations
  • 2017Determining the limit of detection of surface bound antibody8citations
  • 2016Chromium functionalized diglyme plasma polymer coating enhances enzyme-linked immunosorbent assay performance9citations

Places of action

Chart of shared publication
Martinez Botella, Ivan
1 / 1 shared
Gozukara, Yesim
1 / 3 shared
Yalcin, Dilek
1 / 3 shared
Bruton, Eric A.
1 / 1 shared
Kinlen, Patrick
1 / 1 shared
Kohl, Tom
1 / 1 shared
Bamford, Sarah
1 / 1 shared
Espiritu, Maria
1 / 1 shared
Alexander, David
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Howard, Shaun
1 / 4 shared
Greaves, Mark
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Muir, Benjamin Ward
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Crewther, Sheila
1 / 1 shared
Halliday, Mark
1 / 1 shared
Gardner, Wil
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Chouinard, Philippe
1 / 1 shared
Scurr, David
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Torney, Steven
1 / 1 shared
Winkler, David
3 / 3 shared
Pietersz, Geoffrey
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Cutts, Suzanne M.
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Hook, Andrew L.
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Chang, Chien-Yi
1 / 1 shared
Ballabio, Davide
3 / 5 shared
Martyn, C. Davies
1 / 1 shared
Wong, See Yoong
1 / 2 shared
Alexander, Morgan
2 / 4 shared
Williams, Paul
1 / 7 shared
Mei, Ying
1 / 2 shared
Hook, Andrew
1 / 1 shared
Muir, Ben
3 / 10 shared
Winkler, Dave
2 / 17 shared
Madiona, Robert
3 / 3 shared
Bamford, S.
1 / 1 shared
Welch, Nicholas
2 / 2 shared
Jones, Robert
1 / 2 shared
Chart of publication period
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Co-Authors (by relevance)

  • Martinez Botella, Ivan
  • Gozukara, Yesim
  • Yalcin, Dilek
  • Bruton, Eric A.
  • Kinlen, Patrick
  • Kohl, Tom
  • Bamford, Sarah
  • Espiritu, Maria
  • Alexander, David
  • Howard, Shaun
  • Greaves, Mark
  • Muir, Benjamin Ward
  • Crewther, Sheila
  • Halliday, Mark
  • Gardner, Wil
  • Chouinard, Philippe
  • Scurr, David
  • Torney, Steven
  • Winkler, David
  • Pietersz, Geoffrey
  • Cutts, Suzanne M.
  • Hook, Andrew L.
  • Chang, Chien-Yi
  • Ballabio, Davide
  • Martyn, C. Davies
  • Wong, See Yoong
  • Alexander, Morgan
  • Williams, Paul
  • Mei, Ying
  • Hook, Andrew
  • Muir, Ben
  • Winkler, Dave
  • Madiona, Robert
  • Bamford, S.
  • Welch, Nicholas
  • Jones, Robert
OrganizationsLocationPeople

article

Applications of multivariate analysis and unsupervised machine learning to ToF-SIMS images of organic, bioorganic, and biological systems

  • Winkler, David
  • Gardner, Wil
  • Pigram, Paul
  • Muir, Benjamin Ward
Abstract

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging offers a powerful, label-free method for exploring organic, bioorganic, and biological systems. The technique is capable of very high spatial resolution, while also producing an enormous amount of information about the chemical and molecular composition of a surface. However, this information is inherently complex, making interpretation and analysis of the vast amount of data produced by a single ToF-SIMS experiment a considerable challenge. Much research over the past few decades has focused on the application and development of multivariate analysis (MVA) and machine learning (ML) techniques that find meaningful patterns and relationships in these datasets. Here, we review the unsupervised algorithms—that is, algorithms that do not require ground truth labels—that have been applied to ToF-SIMS images, as well as other algorithms and approaches that have been used in the broader family of mass spectrometry imaging (MSI) techniques. We first give a nontechnical overview of several commonly used classes of unsupervised algorithms, such as matrix factorization, clustering, and nonlinear dimensionality reduction. We then review the application of unsupervised algorithms to various organic, bioorganic, and biological systems including cells and tissues, organic films, residues and coatings, and spatially structured systems such as polymer microarrays. We then cover several novel algorithms employed for other MSI techniques that have received little attention from ToF-SIMS imaging researchers. We conclude with a brief outline of potential future directions for the application of MVA and ML algorithms to ToF-SIMS images.

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • experiment
  • spectrometry
  • clustering
  • selective ion monitoring
  • secondary ion mass spectrometry
  • machine learning