Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2005New route of nanowire integration in microfabrication processes for sensor applicationscitations

Places of action

Chart of shared publication
Jebril, Seid
1 / 7 shared
Cimalla, Volker
1 / 18 shared
Cengher, Dorin
1 / 2 shared
Adelung, Rainer
1 / 120 shared
Raudra, Shiva Kumar
1 / 1 shared
Ambacher, Oliver
1 / 40 shared
Wille, Sebastian
1 / 7 shared
Elbahri, Mady
1 / 27 shared
Chart of publication period
2005

Co-Authors (by relevance)

  • Jebril, Seid
  • Cimalla, Volker
  • Cengher, Dorin
  • Adelung, Rainer
  • Raudra, Shiva Kumar
  • Ambacher, Oliver
  • Wille, Sebastian
  • Elbahri, Mady
OrganizationsLocationPeople

article

New route of nanowire integration in microfabrication processes for sensor applications

  • Jebril, Seid
  • Cimalla, Volker
  • Cengher, Dorin
  • Adelung, Rainer
  • Raudra, Shiva Kumar
  • Ambacher, Oliver
  • Paretkar, Dadhichi
  • Wille, Sebastian
  • Elbahri, Mady
Abstract

<p>The integration of nanostructures like nanowires into working devices is often a difficult task. Even though demonstration devices with fascinating properties have been build [1], they are rather far away from being integrated into microelectronic devices. Recently, we successfully demonstrated [2] how thin film fracture can be beneficially used to serve as a template for the fabrication of well aligned nanowires. Here we demonstrate how this approach can be used to integrate nanowires into a conventional silicon microstructure. We use silicon wafers coated with a microstructured photoresist thin film. At special structured predetermined breaking points, designed by conventional lithography steps, nanocracks can be fabricated by using cold gases, see fig. 1a and b. Those cracks serve as a template for the further processing. Most simple, they can just be filled with metal by sputter deposition, resulting in nanowires (see fig. 1c) connected with microstructured power lines. Such an approach can be chosen to fabricate nanosensors. By applying a more sophisticated deposition technique, parallel nanowires can be formed, even with different materials, see fig. 1d. Here, the nanocrack is used as a nanoscale shadow mask. Another variant is the formation of nanochannels by etching into the material. Nanochannels with a width of less than 40 nm could be fabricated, see fig. 1e. Moreover, we demonstrate this process also on flexible polymer substrates. First demonstration circuits, applications in the field of optics, and nanofluidic as well as the details of the fabrication process will be discussed.</p>

Topics
  • Deposition
  • impedance spectroscopy
  • microstructure
  • polymer
  • thin film
  • laser emission spectroscopy
  • crack
  • Silicon
  • etching
  • lithography
  • aligned