Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2023In Situ Study of the Interface-Mediated Solid-State Reactions during Growth and Postgrowth Annealing of Pd/a-Ge Bilayers2citations
  • 2022Structure, electrical, and optical properties of reactively sputter-deposited Ta—Al—N thin films4citations
  • 2019Structural and Thermal Characterisation of Nanofilms by Time-Resolved X-ray Scattering6citations
  • 2018Hydrotreatment of Fast Pyrolysis Bio-oil Fractions Over Nickel-Based Catalyst47citations
  • 2013In situ study of texture development during the growth of magnetron sputtered VC1-x thin filmscitations
  • 2012Influence of the deposition geometry on the microstructure of sputter-deposited V-Al-C-N coatingscitations
  • 2012Microstructure of thin (V,Al)(C,N) hard coatingscitations
  • 2012In situ X-ray study of vanadium carbidecitations

Places of action

Chart of shared publication
Resta, Andrea
1 / 11 shared
Coati, Alessandro
1 / 18 shared
Babonneau, David
1 / 13 shared
Abadias, Gregory
2 / 14 shared
Garreau, Yves
1 / 18 shared
Michel, Anny
1 / 5 shared
Vlad, Alina
1 / 13 shared
Wochner, Peter
1 / 1 shared
Baumbach, Tilo
2 / 15 shared
Plech, Anton
2 / 4 shared
Camelio, Sophie
1 / 6 shared
Anğay, Fırat
1 / 3 shared
Eyidi, Dominique
1 / 14 shared
Zakharova, Margarita
1 / 6 shared
Girmen, Caroline
1 / 1 shared
Buth, Gernot
1 / 2 shared
Eon, Soizic
1 / 1 shared
Bracht, Hartmut
1 / 1 shared
Raffelt, Klaus
1 / 3 shared
Otto, Thomas
1 / 16 shared
Dahmen, Nicolaus
1 / 4 shared
Rapp, Michael
1 / 3 shared
Schmitt, Caroline Carriel
1 / 2 shared
Zimina, Anna
1 / 12 shared
Grunwaldt, Jan-Dierk
1 / 33 shared
Baumbach, T.
4 / 17 shared
Doyle, S.
3 / 14 shared
Kaufholz, M.
1 / 1 shared
Kotapati, S.
1 / 1 shared
Stüber, M.
4 / 62 shared
Ulrich, S.
4 / 81 shared
Mantilla, M.
1 / 1 shared
Mangold, S.
1 / 4 shared
Darma, S.
3 / 3 shared
Chart of publication period
2023
2022
2019
2018
2013
2012

Co-Authors (by relevance)

  • Resta, Andrea
  • Coati, Alessandro
  • Babonneau, David
  • Abadias, Gregory
  • Garreau, Yves
  • Michel, Anny
  • Vlad, Alina
  • Wochner, Peter
  • Baumbach, Tilo
  • Plech, Anton
  • Camelio, Sophie
  • Anğay, Fırat
  • Eyidi, Dominique
  • Zakharova, Margarita
  • Girmen, Caroline
  • Buth, Gernot
  • Eon, Soizic
  • Bracht, Hartmut
  • Raffelt, Klaus
  • Otto, Thomas
  • Dahmen, Nicolaus
  • Rapp, Michael
  • Schmitt, Caroline Carriel
  • Zimina, Anna
  • Grunwaldt, Jan-Dierk
  • Baumbach, T.
  • Doyle, S.
  • Kaufholz, M.
  • Kotapati, S.
  • Stüber, M.
  • Ulrich, S.
  • Mantilla, M.
  • Mangold, S.
  • Darma, S.
OrganizationsLocationPeople

document

Influence of the deposition geometry on the microstructure of sputter-deposited V-Al-C-N coatings

  • Baumbach, T.
  • Mangold, S.
  • Krause, Bärbel
  • Doyle, S.
  • Stüber, M.
  • Ulrich, S.
  • Darma, S.
Abstract

Contribution submission to the conference Berlin 2012of sputter-deposited V-Al-C-N coatings — Susan Darma1 ,TechnologieMulti-element hard coating materials such as V-Al-C-N are of great interest for many technological applications. Their mechanical propertiesdepend on the composition and microstructure of the coating. In orderto determine the optimum composition and deposition conditions ofthese complex materials, many samples are required. One powerful toolfor reducing the number of experiments is based on the so-called combinatorial approach for thin film deposition: many different thin filmsamples can be realized simultaneously, exploiting the deposition gradient resulting from codeposition of several materials. We will present anX-ray diffraction study of the influence of the deposition geometry onthe microstructure of V-Al-C-N coatings. The films were deposited byreactive RF magnetron sputtering from a segmented target composedof AlN and VC. Synchrotron radiation measurements where performedat the beamline PDIFF at ANKA. Significant texture changes were observed which can be attributed to the deposition geometry, as verifiedby calculations of the flux distribution. We conclude that codepositioncan accelerate significantly the screening of new materials, under thecondition that the desired property is not significantly influenced bythe microstructural changes due to the deposition geometry.Part:Type:Topic:Email:DSPosterThin Film Characterisation: StructureAnalysis and Composition (XRD, TEM,XPS, SIMS, RBS, ...)

Topics
  • Deposition
  • impedance spectroscopy
  • microstructure
  • x-ray diffraction
  • experiment
  • thin film
  • x-ray photoelectron spectroscopy
  • transmission electron microscopy
  • texture
  • selective ion monitoring
  • Rutherford backscattering spectrometry