• Rossall, Andrew K.
• Singh, Rashmi
• Dhareshwar, L. J.
• Gupta, N. K.
• Murali, C. G.
• Tripathi, S.
• Munda, D. S.
• Kohli, D. K.
• Mishra, G.
• Tallents, Gregory John
• Khardekar, R. K.
• Chaurasia, S.

Abstract

<p>Experiments were performed with a 15 J/500 ps Nd:glass laser (lambda = 1064 nm) focussed to an intensity &gt;10(14) W/cm(2). X-ray emissions from carbon foam and 5% Pt-doped carbon foam of density 150-300 mg/cc were compared with that of the solid carbon targets. The thickness of the carbon foam was 15 pm on a graphite substrate. X-ray emission was measured using semiconductor X-ray diodes covered with various filters having transmissions in different X-ray spectral ranges. It covered X-ray spectrum of 0.8-8.5 keV range. The X-ray emission in the soft X-ray region was observed to increase to about 1.8 times and 2.3 times in carbon foam and Pt-doped foam, respectively with respect to solid carbon. In hard X-rays, there was no measurable difference amongst the carbon foam, Pt-doped carbon foam and solid carbon. Scanning electron microscope (SEM) analysis demonstrates that foam targets smoothens the crater formed by the laser irradiation.</p>

Topics

• density
• Carbon
• scanning electron microscopy
• experiment
• glass
• semiconductor
• glass