Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Dell, John

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (20/20 displayed)

  • 2017Large-Area MEMS Tunable Fabry-Perot Filters for Multi/Hyperspectral Infrared Imaging33citations
  • 2016Preparation and characterization of cerium substituted bismuth dysprosium iron garnets for magneto-optic applications6citations
  • 2015Investigation of ICPECVD Silicon Nitride Films for HgCdTe Surface Passivation14citations
  • 2014Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording2citations
  • 2014Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recordingcitations
  • 2014Investigation of cerium-substituted europium iron garnets deposited by biased target ion beam deposition17citations
  • 2014GaSb: A new alternative substrate for epitaxial growth of HgCdTe48citations
  • 2011Thermally induced damages of PECVD SiNx thin films7citations
  • 2007Dielectric thin films for MEMS-based optical sensors13citations
  • 2007Poisson's Ratio of Low-Temperature PECVD Silicon Nitride Thin Films30citations
  • 2007Process condition dependence of mechanical and physical properties of silicon nitride thin films10citations
  • 2006Thermal Stability of PECVD SiN/sub x/ Films1citations
  • 2006Effect of oxidation on the chemical bonding structure of PECVD SiN thin films29citations
  • 2006Stress in low-temperature plasma enhanced chemical vapour deposited silicon nitride thin films40citations
  • 2005Characterization of Mechanical Properties of Silicon Nitride Thin Films for MEMS Devices by Nanoindentationcitations
  • 2005Effects of deposition temperature on the mechanical and physical properties of silicon nitride thin films27citations
  • 2005Determination of mechanical properties of PECVD silicon nitride thin films for tunable MEMS Fabry-Perot optical filters70citations
  • 2005Evaluation of Plasma Deposited Silicon Nitride Thin Flims for Microsystems Technology7citations
  • 2004Laser-Beam-Induced Current Mapping of Spatial Nonuniformities in Molecular Beam Epitaxy As-Grown HgCdTe6citations
  • 2004Dark Currents in Long Wavelength Infrared HgCdTe Gated Photodiodes24citations

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Chart of shared publication
Bumgarner, John
1 / 1 shared
Martyniuk, Mariusz
8 / 16 shared
Tripathi, Dhirendra Kumar
1 / 2 shared
Ren, Yongling
1 / 3 shared
Mao, Haifeng
1 / 1 shared
Antoszewski, Jaroslaw
7 / 13 shared
Silva, Dilusha
2 / 4 shared
Faraone, Lorenzo
18 / 31 shared
Woodward, R. C.
2 / 2 shared
Krishnan, N. Radha
1 / 1 shared
Jeffery, R. D.
3 / 3 shared
Saunders, Martin
2 / 33 shared
Zhang, J.
1 / 62 shared
Gu, Renjie
2 / 7 shared
Umana-Membreno, Gilberto A.
1 / 7 shared
Lei, Wen
2 / 5 shared
Baldwin, D.
1 / 1 shared
Jeffery, R.
1 / 1 shared
Krishnan, R. N.
2 / 2 shared
Cliff, J.
1 / 1 shared
Cliff, John
1 / 1 shared
Woodward, Rob
2 / 3 shared
Baldwin, D. A.
1 / 1 shared
Silva, K. K. M. B. D.
1 / 1 shared
Nachimuthu, Radha Krishnan
1 / 1 shared
Metaxas, Peter
1 / 2 shared
Jehanathan, N.
2 / 4 shared
Liu, Yinong
8 / 35 shared
Musca, Charles
7 / 8 shared
Bush, Mark
4 / 4 shared
Walmsley, B. A.
3 / 3 shared
Keating, Adrian
1 / 7 shared
Walmsley, B.
2 / 3 shared
Jehanathan, Neerushana
1 / 1 shared
Winchester, K. J.
3 / 3 shared
Huang, H.
2 / 12 shared
Savvides, N.
1 / 1 shared
Soh, Martin
1 / 1 shared
Sewell, Richard
1 / 1 shared
Nguyen, Thuyen
1 / 1 shared
Chart of publication period
2017
2016
2015
2014
2011
2007
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2005
2004

Co-Authors (by relevance)

  • Bumgarner, John
  • Martyniuk, Mariusz
  • Tripathi, Dhirendra Kumar
  • Ren, Yongling
  • Mao, Haifeng
  • Antoszewski, Jaroslaw
  • Silva, Dilusha
  • Faraone, Lorenzo
  • Woodward, R. C.
  • Krishnan, N. Radha
  • Jeffery, R. D.
  • Saunders, Martin
  • Zhang, J.
  • Gu, Renjie
  • Umana-Membreno, Gilberto A.
  • Lei, Wen
  • Baldwin, D.
  • Jeffery, R.
  • Krishnan, R. N.
  • Cliff, J.
  • Cliff, John
  • Woodward, Rob
  • Baldwin, D. A.
  • Silva, K. K. M. B. D.
  • Nachimuthu, Radha Krishnan
  • Metaxas, Peter
  • Jehanathan, N.
  • Liu, Yinong
  • Musca, Charles
  • Bush, Mark
  • Walmsley, B. A.
  • Keating, Adrian
  • Walmsley, B.
  • Jehanathan, Neerushana
  • Winchester, K. J.
  • Huang, H.
  • Savvides, N.
  • Soh, Martin
  • Sewell, Richard
  • Nguyen, Thuyen
OrganizationsLocationPeople

document

Characterization of mechanical, optical and structural properties of bismuth oxide thin films as a write-once medium for blue laser recording

  • Dell, John
  • Cliff, John
  • Woodward, Rob
  • Martyniuk, Mariusz
  • Krishnan, R. N.
  • Baldwin, D. A.
  • Silva, K. K. M. B. D.
  • Jeffery, R. D.
  • Faraone, Lorenzo
Abstract

We report on the preparation and characterization of crystalline bismuth oxide thin films via Biased Target Ion Beam Deposition method. A focused blue laser (405nm) is used to write an array of dots in the bismuth oxide thin film and demonstrate clear and circular recording marks in form of bubbles or little volcanos (FWHM ∼500nm). Results indicate excellent static recording characteristics, writing sensitivity and contrast. The recording mechanism is investigated and is believed to be related to laser-induced morphology change. Copyright © Materials Research Society 2014.

Topics
  • impedance spectroscopy
  • thin film
  • Bismuth
  • ion beam deposition