Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2008Amorphization of ZnAl2O4 spinel under heavy ion irradiationcitations

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Chart of shared publication
Bouffard, S.
1 / 2 shared
Monnet, Isabelle
1 / 24 shared
Quentin, A.
1 / 2 shared
Gosset, D.
1 / 19 shared
Chart of publication period
2008

Co-Authors (by relevance)

  • Bouffard, S.
  • Monnet, Isabelle
  • Quentin, A.
  • Gosset, D.
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document

Amorphization of ZnAl2O4 spinel under heavy ion irradiation

  • Bouffard, S.
  • Monnet, Isabelle
  • Quentin, A.
  • Gosset, D.
  • Lefrançois, B.
Abstract

ZnAl2O4 spinels have been irradiated with several ions (Ne, S, Kr and Xe) at the IRRSUD beam-line of the GANIL facility, in order to determine irradiation conditions (stopping power, fluence) for amorphisation. We observed by Transmission Electron Microscopy (TEM) that with Xe ions at 92 MeV, individual ion tracks are still crystalline, whereas an amorphisation starts below a fluence of 5.1012 cm-2 up to a total amorphisation between 1x1013 and 1x1014 cm-2. The coexistence of amorphous and crystalline domains in the same pristine grain is clearly visible in the TEM images. All the crystalline domains remain close to the same orientation as the original grain. According to TEM and X-Ray Diffraction (XRD) results, the stopping power threshold for amorphisation is between 9 and 12 keV.nm-1.

Topics
  • impedance spectroscopy
  • amorphous
  • grain
  • x-ray diffraction
  • transmission electron microscopy