Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2014Lattice-mismatched GaInP LED devices and methods of fabricating samecitations

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Steiner, Myles A.
1 / 8 shared
Zhang, Yong
1 / 5 shared
Mascarenhas, Angelo
1 / 1 shared
Chart of publication period
2014

Co-Authors (by relevance)

  • Steiner, Myles A.
  • Zhang, Yong
  • Mascarenhas, Angelo
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patent

Lattice-mismatched GaInP LED devices and methods of fabricating same

  • Steiner, Myles A.
  • Zhang, Yong
  • Mascarenhas, Angelo
  • Bhusal, Lekhnath
Abstract

A method (100) of fabricating an LED or the active regions of an LED and an LED (200). The method includes growing, depositing or otherwise providing a bottom cladding layer (208) of a selected semiconductor alloy with an adjusted bandgap provided by intentionally disordering the structure of the cladding layer (208). A first active layer (202) may be grown above the bottom cladding layer (208) wherein the first active layer (202) is fabricated of the same semiconductor alloy, with however, a partially ordered structure. The first active layer (202) will also be fabricated to include a selected n or p type doping. The method further includes growing a second active layer (204) above the first active layer (202) where the second active layer (204) Is fabricated from the same semiconductor alloy.

Topics
  • impedance spectroscopy
  • semiconductor