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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Liu, Qiang
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Topics
Publications (12/12 displayed)
- 2024Design and modelling of a reversible shape memory alloy torsion hinge actuatorcitations
- 2024Mimosa
- 2024A comparative study on green synthesis and characterization of Mn doped ZnO nanocomposite for antibacterial and photocatalytic applicationscitations
- 2023Shape memory alloy actuators for haptic wearablescitations
- 2017Modelling and Simulations of Nanoindentation in Single Crystalscitations
- 2016Review of the accuracy and precision of mm-wave antenna simulations and measurementscitations
- 2016Size-dependent crystal plasticity: From micro-pillar compression to bendingcitations
- 2014Phase transition in ferroelectric Pb(Zr 0.52 Ti 0.48 )O 3 epitaxial thin filmscitations
- 2014Identification of inhomogeneous concrete cover by non-contact ultrasonic method
- 2014Phase transition in ferroelectric Pb(Zr0.52Ti0.48)O3 epitaxial thin films
- 2014Phase transition in ferroelectric Pb(Zr0.52Ti0.48)O3 epitaxial thin films
- 2013A parametric study of laser induced-effects in terbium-doped borosilicate glassescitations
Places of action
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article
Phase transition in ferroelectric Pb(Zr0.52Ti0.48)O3 epitaxial thin films
Abstract
PbZr1−xTixO3 (PZT) has been intensively studied for various ferroelectric applications. Its promising application for micro-electro-mechanical system has reignited the interests due to its outstanding ferroelectric and piezoelectric properties.Most PZT ceramics employed in devices are synthesized with a Zr/Ti ratio close to the tetragonal– rhombohedral morphotropic phase boundary (x = 0.48) due to its high electro-mechanical coupling at this composition. Morphotropic phase boundary is particularly interesting to study for the investigation of phase transition. In this work, we report the epitaxial growth and electrical characterization of epitaxial PZT (Zr/Ti = 52/48) thin films on Nb-doped SrTiO3. PZT films, with thickness from30 nmto 65 nm, were deposited by sol–gelmethod and eventually crystallized at 700 °C by rapid thermal annealing in oxygen. Filmferroelectricity was confirmed by Sawyer–Tower circuit measurement. X-ray diffraction analysis indicates a thicknessdependent structural phase, i.e., a phase transition from tetragonal phase for the thinner film to a biphasic (tetragonal + pseudo-cubic) structure for the thicker film, which is characterized by ellipsometry as a phase separation from the bottom surface of the film to the top one. This phase transition is related to a composition gradient within the film thickness.