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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Kočí, Jan | Prague |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Kanki, T.
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article
Nanoscale study of perovskite BiFeO3/spinel (Fe, Zn)3O4 co-deposited thin film by electrical scanning probe methods
Abstract
International audience ; For this study, a BiFeO3 (BFO) perovskite/(Fe,Zn)3O4 (FZO) spinel sample grown on SrTiO3:Nb (0 0 1) has been prepared using pulsed laser deposition with a single target composition of (Bi1.1FeO3)0.65(Fe2.2Zn0.8O4)0.35. The nanoscale electrical properties of ferroelectric BFO/semi-conducting FZO thin film have been investigated using piezoresponse force microscopy (PFM) and conductive-atomic force microscopy (C-AFM). Scanning probe methods reveal that BFO grows as nano-islets with a complex structure which is coherent with the cross-sectional high-angle annular dark-field scanning transmission electron microscopy (HAADF-STEM) images. The comparison between nanoscale electrical techniques and HAADF-STEM images have allowed to understand the origin of the different physical properties of the multiferroic/magnetoconductive co-deposited thin film at the nanoscale. By using PFM/C-AFM techniques, we were able to fully distinguish BFO and FZO materials in the nanostructured sample without using destructive material characterization methods.