Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2023Study of process parameters and characteristics properties of W coatings deposited by rf plasma sputtering1citations
  • 2023High sensitivity measurements of gas transport through films for food packaging and the O2 adsorption issue1citations
  • 2020Effects of a nitrogen seeded plasma on nanostructured tungsten films having fusion-relevant features16citations
  • 2019Influence of surface roughness on sputtering of Mo under keV D ions irradiationcitations
  • 2019Influence of surface roughness on sputtering of Mo under keV D ions irradiationcitations
  • 2019Surface pre-treatments to improve joint strength of ceramicscitations

Places of action

Chart of shared publication
Stinchelli, Andrea
1 / 1 shared
Chen, Hao
1 / 10 shared
Pietralunga, Silvia Maria
1 / 1 shared
Vassallo, Espedito
5 / 5 shared
Fonzo, Fabio Di
1 / 5 shared
Aloisio, Marco
1 / 1 shared
Nardone, Antonio
1 / 1 shared
Minelli, Daniele
2 / 2 shared
Perego, Patrizia
1 / 3 shared
Schott, Marine
1 / 4 shared
Setina, Janez
1 / 1 shared
Firpo, Giuseppe
1 / 4 shared
Campardelli, Roberta
1 / 3 shared
Repetto, Luca
1 / 7 shared
Granucci, Gustavo
1 / 1 shared
Mesto, Ernesto
1 / 1 shared
Laguardia, Laura
1 / 1 shared
Dellera, Fabio
1 / 1 shared
Ricci, Daria
1 / 1 shared
Passoni, Matteo
3 / 3 shared
Donnini, Riccardo
1 / 5 shared
Pezzoli, Andrea
1 / 1 shared
Dellasega, David
3 / 5 shared
Caniello, Roberto
1 / 1 shared
Ghezzi, Francesco
1 / 2 shared
Torre, Davide Della
1 / 1 shared
Uccello, Andrea
1 / 1 shared
Schwarz-Selinger, Thomas
2 / 7 shared
Hakola, Antti
2 / 16 shared
Pelicon, Primoz
2 / 3 shared
Kelemen, Mitja
2 / 3 shared
Markelj, Sabina
2 / 2 shared
Contributors, Wp Pfc
1 / 3 shared
Suess, Manuela
1 / 1 shared
Casalegno, Valentina
1 / 33 shared
Ferraris, Monica
1 / 76 shared
Salvo, Milena
1 / 58 shared
Wilhelmi, Christian
1 / 2 shared
Chart of publication period
2023
2020
2019

Co-Authors (by relevance)

  • Stinchelli, Andrea
  • Chen, Hao
  • Pietralunga, Silvia Maria
  • Vassallo, Espedito
  • Fonzo, Fabio Di
  • Aloisio, Marco
  • Nardone, Antonio
  • Minelli, Daniele
  • Perego, Patrizia
  • Schott, Marine
  • Setina, Janez
  • Firpo, Giuseppe
  • Campardelli, Roberta
  • Repetto, Luca
  • Granucci, Gustavo
  • Mesto, Ernesto
  • Laguardia, Laura
  • Dellera, Fabio
  • Ricci, Daria
  • Passoni, Matteo
  • Donnini, Riccardo
  • Pezzoli, Andrea
  • Dellasega, David
  • Caniello, Roberto
  • Ghezzi, Francesco
  • Torre, Davide Della
  • Uccello, Andrea
  • Schwarz-Selinger, Thomas
  • Hakola, Antti
  • Pelicon, Primoz
  • Kelemen, Mitja
  • Markelj, Sabina
  • Contributors, Wp Pfc
  • Suess, Manuela
  • Casalegno, Valentina
  • Ferraris, Monica
  • Salvo, Milena
  • Wilhelmi, Christian
OrganizationsLocationPeople

document

Influence of surface roughness on sputtering of Mo under keV D ions irradiation

  • Schwarz-Selinger, Thomas
  • Contributors, Wp Pfc
  • Hakola, Antti
  • Pelicon, Primoz
  • Dellasega, David
  • Kelemen, Mitja
  • Vassallo, Espedito
  • Markelj, Sabina
  • Pedroni, Matteo
  • Passoni, Matteo
Abstract

An important issue in the development of thermonuclear fusion is the lifetime of the reactor walls. Irradiation by ions and neutrals will lead to erosion of the wall materials, contaminating the plasma and reducing the lifetime of plasma facing components. For perfectly smooth surfaces a theoretical model predicts sputter yields with great accuracy [1] showing a distinct angular dependence of the sputter yield [2]. However, when dealing with rough surfaces the experimental results deviate from model predictions and also the angle dependence is less distinct. Within the Eurofusion work package PFC a dedicated task was launched to quantitatively determine the influence of roughness on the sputter yield [3].<br/>To address this issue erosion of molybdenum (Mo) thin films on graphite substrate by deuterium (D) ions was investigated. Such composition of samples was chosen on the basis that same studies ants to be carried out in ASDEX Upgrade. For this purpose we constructed an experimental setup where samples are exposed to D ions generated by an electron cyclotron resonance ion gun. The dominating ion species coming out from the ion gun are D3+ ions, which are accelerated by applying 3.1 kV voltage in this case and decelerated in front of the sample to 3.0 keV, therefore yielding 1 keV energy per D.<br/>120 nm thick Mo films deposited by pulsed laser deposition on graphite substrate of different roughness were produced for this purpose. The surfaces roughness (Ra) ranged from mirror polished surfaces (Ra= 5 nm) to rough surface (Ra= 2-3 µm). Samples were exposed to 1.5×1023 D ions/m2 at different impact angles with respect to the surface (0°, 40°, 60° and 70°). The erosion was determined by measuring Mo areal density before and after the exposure by Rutherford Backscattering Spectroscopy (RBS). The RBS measurements were performed by 2.5 MeV 4He ion beam. In the presented contribution results of the effect of surface roughness on sputter yields and its angular dependence will be discussed in details as we observed clear angular dependence for Ra~5 nm which is smeared out at higher surfaces roughness.

Topics
  • density
  • impedance spectroscopy
  • surface
  • molybdenum
  • thin film
  • laser emission spectroscopy
  • pulsed laser deposition
  • Rutherford backscattering spectrometry