Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2015Electrode interface controlled electrical properties in epitaxial Pb(Zr0.52Ti0.48)O-3 films grown on Si substrates with SrTiO3 buffer layercitations
  • 2015Comparison between the ferroelectric/electric properties of the PbZr0.52Ti0.48O3 films grown on Si (100) and on STO (100) substratescitations
  • 2015Towards ferroelectric control of topological insulators and surface statescitations

Places of action

Chart of shared publication
Pintilie, L.
2 / 8 shared
Pasuk, I.
2 / 11 shared
Pintilie, I.
2 / 5 shared
Chirila, C.
2 / 4 shared
Negrea, R.
2 / 4 shared
Trupina, L.
2 / 4 shared
Vilquin, Bertrand
3 / 68 shared
Boni, A.
2 / 8 shared
Yin, Shi
1 / 2 shared
Tortech, L.
1 / 4 shared
Barrett, N.
1 / 13 shared
Mathieu, C.
1 / 7 shared
Renault, O.
1 / 8 shared
Copie, O.
1 / 15 shared
Chart of publication period
2015

Co-Authors (by relevance)

  • Pintilie, L.
  • Pasuk, I.
  • Pintilie, I.
  • Chirila, C.
  • Negrea, R.
  • Trupina, L.
  • Vilquin, Bertrand
  • Boni, A.
  • Yin, Shi
  • Tortech, L.
  • Barrett, N.
  • Mathieu, C.
  • Renault, O.
  • Copie, O.
OrganizationsLocationPeople

document

Towards ferroelectric control of topological insulators and surface states

  • Tortech, L.
  • Barrett, N.
  • Mathieu, C.
  • Renault, O.
  • Rhun, G. Le
  • Copie, O.
  • Vilquin, Bertrand
Abstract

The ferroelectric control of the electronic properties of topological or surface states is a very promising approach for future electronic applications such as in spintronics. Recently, first principle calculations have predicted that bismuth (Bi) spin Rashba splitting can be manipulated by the spontaneous electronic polarization of a ferroelectric material [1]. The purpose of our work is thus to determine directly the effect of the electric polarization of written ferroelectric domains on the Rashba spin splitting of a thin Bi layer using spatially resolved photoemission spectroscopy. Towards this goal, on the one hand, ferrolectric domains were polarized in (Pb,Zr)TiO3 thin film using piezoresponse force microscopy (PFM). Then, we have characterized these domains using energy filtered photoelectron emission microscopy (PEEM) and low energy electron microscopy (LEEM). On the other hand, we have optimized and characterized the growth of Bi by e-beam evaporation on an oxide substrate. Finally, we performed PEEM experiments in the momentum space to measure the electronic band structure of the Bi thin film deposited on the oxide substrate and the ferroelectric material. This approach will show the control of electronic properties, while measuring in situ the band structure by photoemission spectroscopy, and it will illustrate the direct response of electric manipulation of the spin degree of freedom for spintronics application. [1] H. Mirhosseini et al., PRB 81, 073406 (2010).

Topics
  • impedance spectroscopy
  • surface
  • experiment
  • thin film
  • electron microscopy
  • evaporation
  • band structure
  • Bismuth