Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2012Junction formation of Cu3BiS3 investigated by Kelvin probe force microscopy and surface photovoltage measurementscitations

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Grimm, Alexander
1 / 5 shared
Baier, Robert
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Dittrich, Thomas
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Sadewasser, Sascha
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2012

Co-Authors (by relevance)

  • Grimm, Alexander
  • Baier, Robert
  • Dittrich, Thomas
  • Sadewasser, Sascha
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document

Junction formation of Cu3BiS3 investigated by Kelvin probe force microscopy and surface photovoltage measurements

  • Grimm, Alexander
  • Baier, Robert
  • Dittrich, Thomas
  • Sadewasser, Sascha
  • Luxsteiner, Martha Ch.
Abstract

Recently, the compound semiconductor Cu 3 BiS 3 has been demonstrated to have a band gap of ~1.4 eV, well suited for photovoltaic energy harvesting. The preparation of polycrystalline thin films was successfully realized and now the junction formation to the n-type window needs to be developed. We present an investigation of the Cu 3 BiS 3 absorber layer and the junction formation with CdS, ZnS and In 2 S 3 buffer layers. Kelvin probe force microscopy shows the granular structure of the buffer layers with small grains of 20–100 nm, and a considerably smaller work-function distribution for In 2 S 3 compared to that of CdS and ZnS. For In 2 S 3 and CdS buffer layers the KPFM experiments indicate negatively charged Cu 3 BiS 3 grain boundaries resulting from the deposition of the buffer layer. Macroscopic measurements of the surface photovoltage at variable excitation wavelength indicate the influence of defect states below the band gap on charge separation and a surface-defect passivation by the In 2 S 3 buffer layer. Our findings indicate that Cu 3 BiS 3 may become an interesting absorber material for thin-film solar cells; however, for photovoltaic application the band bending at the charge-selective contact has to be increased.

Topics
  • Deposition
  • surface
  • compound
  • grain
  • experiment
  • thin film
  • semiconductor
  • defect
  • Kelvin probe force microscopy