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De La Fuente, German Francisco
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Publications (5/5 displayed)
- 2023Grain Orientation, Angle of Incidence, and Beam Polarization Effects on Ultraviolet 300 ps‐Laser‐Induced Nanostructures on 316L Stainless Steelcitations
- 2023Data for "Grain orientation, angle of incidence, and beam polarization effects on UV-300 ps-laser-induced nanostructures on 316L stainless steel"
- 2022Highly Regular Hexagonally-Arranged Nanostructures on Ni-W Alloy Tapes upon Irradiation with Ultrashort UV Laser Pulsescitations
- 2022Use of Green Fs Lasers to Generate a Superhydrophobic Behavior in the Surface of Wind Turbine Bladescitations
- 2017Laser Zone Melting and microstructure of waveguide coatings obtained on soda‐lime glasscitations
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document
Data for "Grain orientation, angle of incidence, and beam polarization effects on UV-300 ps-laser-induced nanostructures on 316L stainless steel"
Abstract
Dataset for the paper entitled "Grain orientation, angle of incidence, and beam polarization effects on UV-300 ps-laser-induced nanostructures on 316L stainless steel", published in Laser & Photonics Reviews (2023) 2300589 (DOI: 10.1002/lpor.202300589) Commercially available, laminated and polished AISI 316 stainless steel surfaces were thus laser treated on large surface areas by ultraviolet sub-ns laser pulses (355 nm, 300 ps, 300 kHz) in a line scanning approach, while continuously feeding the sample in the direction perpendicular to the scanning of the focused laser beam. The generation of so-called low spatial frequency LIPSS (LSFL) were studied in detail for different angles of incidence of the laser radiation to the steel surface (0°, 30°, 45°) and for different linear laser polarizations (s- and p-polarized). Electron back scattering diffraction (EBSD) analyses allowed us to associate site-selectively with various different grain-specific laser-induced-surface morphologies and the underlying crystalline grain orientation (Euler angles) for a large ensemble of > 800 representative individual grains. This dataset includes: - Original SEM images used for description of different type of LIPSS (or ripples) - Original SEM images used for 2D Fast Fourier Transform (2D-FFT) maps - Original EBSD files (Aztec software) and SEM images used to analyse the correspondence between LIPSS 's type formed on each grain and the Euler angles (crystallographic orientation) of that particular grain.