Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Topics

Publications (1/1 displayed)

  • 2024Dielectric Properties of Disordered A6B2O17 (A = Zr; B = Nb, Ta) Phases1citations

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Chart of shared publication
Marakovits, Michael
1 / 1 shared
Spangler, Ryan
1 / 1 shared
Hayden, John
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Casamento, Joseph
1 / 1 shared
Maria, Jon-Paul
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Spurling, R. Jackson
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Lanagan, Michael
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Chart of publication period
2024

Co-Authors (by relevance)

  • Marakovits, Michael
  • Spangler, Ryan
  • Hayden, John
  • Casamento, Joseph
  • Maria, Jon-Paul
  • Spurling, R. Jackson
  • Lanagan, Michael
OrganizationsLocationPeople

document

Dielectric Properties of Disordered A6B2O17 (A = Zr; B = Nb, Ta) Phases

  • Marakovits, Michael
  • Spangler, Ryan
  • Hayden, John
  • Casamento, Joseph
  • Almishal, Saeed S. I.
  • Maria, Jon-Paul
  • Spurling, R. Jackson
  • Lanagan, Michael
Abstract

We report on the structure and dielectric properties of ternary A6B2O17 (A = Zr; B = Nb, Ta) thin films and ceramics. Thin films are produced via sputter deposition from dense, phase-homogenous bulk ceramic targets, which are synthesized through a reactive sintering process at 1500 °C. Crystal structure, microstructure, chemistry and dielectric properties are characterized by X-ray diffraction and reflectivity, atomic force microscopy, X-ray photoelectron spectroscopy, and capacitance analysis respectively. We observe relative permittivities approaching 60 and loss tangents < 10^-2 across the 10^3-10^5 Hz frequency range in the Zr6Nb2O17 and Zr6Ta2O17 phases. These observations create an opportunity space for this novel class of disordered oxide electroceramics.

Topics
  • Deposition
  • microstructure
  • phase
  • x-ray diffraction
  • thin film
  • x-ray photoelectron spectroscopy
  • atomic force microscopy
  • reactive
  • ceramic
  • sintering