• Schmitt, Vivien
• Niebojewski, Heimanu
• Maurand, Romain
• Winkelmann, Clemens
• Bertrand, Benoit
• Jehl, Xavier
• Brun, Boris
• Champain, Victor
• Franceschi, Silvano De

Abstract

We report local time-resolved thermometry in a silicon nanowire quantum dot device designed to host a linear array of spin qubits. Using two alternative measurement schemes based on rf reflectometry, we are able to probe either local electron or phonon temperatures with $μ$s-scale time resolution and a noise equivalent temperature of $3$ $ mK/{ Hz}$. Following the application of short microwave pulses, causing local periodic heating, time-dependent thermometry can track the dynamics of thermal excitation and relaxation, revealing clearly different characteristic time scales. This work opens important prospects to investigate the out-of-equilibrium thermal properties of semiconductor quantum electronic devices operating at very low temperature. In particular, it may provide a powerful handle to understand heating effects recently observed in semiconductor spin-qubit systems.

Topics

• semiconductor
• Silicon
• quantum dot
• reflectometry