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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Baudin, Emmanuel
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Publications (4/4 displayed)
- 2023Layer‐controlled nonlinear terahertz valleytronics in two‐dimensional semimetal and semiconductor PtSe 2citations
- 2023Raman Spectroscopy of Monolayer to Bulk PtSe2 Exfoliated Crystalscitations
- 2022Dielectric permittivity, conductivity and breakdown field of hexagonal boron nitridecitations
- 2022Dielectric permittivity, conductivity and breakdown field of hexagonal boron nitridecitations
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article
Raman Spectroscopy of Monolayer to Bulk PtSe2 Exfoliated Crystals
Abstract
Raman spectroscopy is widely used to assess the quality of 2D materials thin films. This report focuses on ${PtSe_2}$, a noble transition metal dichalcogenide which has the remarkable property to transit from a semi-conductor to a semi-metal with increasing layer number. While polycrystalline ${PtSe_2}$ can be grown with various cristalline qualities, getting insight into the monocrystalline intrinsic properties remains challenging. We report on the study of exfoliated 1 to 10 layers ${PtSe_2}$ by Raman spectroscopy, featuring record linewidth. The clear Raman signatures allow layer-thickness identification and provides a reference metrics to assess crystal quality of grown films.