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| Naji, M. |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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Sugiyama, Masakazu
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Publications (3/3 displayed)
- 2019MIS Structures for Solar Cells Perimeter Passivation
- 2010High Quality Thin Body III-V-On-Insulator Channel Layer Transfer on Si Wafer Using Direct Wafer Bondingcitations
- 2010III-V-semiconductor-on-insulator n-channel metal-insulator-semiconductor field-effect transistors with buried Al2O3 layers and sulfur passivation: Reduction in carrier scattering at the bottom interfacecitations
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article
MIS Structures for Solar Cells Perimeter Passivation
Abstract
Perimeter recombination takes place in all photovoltaic architectures, its detrimental effect increasing with the perimeter to area ratio. A new efficient passivation method is introduced here, inspired by the working principle of MOSFETs. It consists in a Metal Insulator stack, deposited on top of the Semiconductor structure. As a transistor, it acts as a switch to prevent the flow of majority carriers towards the defective side walls. Simulation results show that the detrimental effect of perimeter recombination can be reduced by half in the particular case of a GaAs solar cell under one sun illumination. Because no chemical treatment is involved, our MIS based passivation solution can be adapted to various photovoltaic materials as a perspective. A possible additional application will be devices working under intense illumination, where resistive effects are a limiting factor. 36th European Photovoltaic Solar Energy Conference and Exhibition; 615-617