Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2022Fabrication possibilities and characterisation of chalcogenide glass-based sensors for bromide determinationcitations
  • 2021Chalcogenide glass-based sulphide sensor in thick film technologycitations
  • 2021Iodide determination with chalcogenide glass electrodes3citations
  • 2018Investigation towards the optimum of power capability, ageing stability and costs effectiveness on thick film resistor pastes for AlN ceramicscitations
  • 2012Development and characterization of glass matrix composites as porous coating film of a solid state reference electrodecitations

Places of action

Chart of shared publication
Schneider, Werner
1 / 1 shared
Partsch, Uwe
4 / 15 shared
Enseleit, Ute
3 / 3 shared
Vonau, Winfried
3 / 3 shared
Marcinkowski, Manja
1 / 3 shared
Schmidt, Richard
1 / 4 shared
Eberstein, Markus
1 / 12 shared
Furche, Stefan
1 / 1 shared
Chart of publication period
2022
2021
2018
2012

Co-Authors (by relevance)

  • Schneider, Werner
  • Partsch, Uwe
  • Enseleit, Ute
  • Vonau, Winfried
  • Marcinkowski, Manja
  • Schmidt, Richard
  • Eberstein, Markus
  • Furche, Stefan
OrganizationsLocationPeople

article

Investigation towards the optimum of power capability, ageing stability and costs effectiveness on thick film resistor pastes for AlN ceramics

  • Marcinkowski, Manja
  • Schmidt, Richard
  • Partsch, Uwe
  • Feller, Claudia
Abstract

<jats:title>Abstract</jats:title><jats:p>The focus of this work was the optimization of a 10 Ω/□ thick film resistor (TFR) paste composition to obtain increased power capability, aging stability and minimum use of ruthenium oxide for cost savings without changing the defined narrow sheet resistance (R□) and temperature coefficient of resistance (TCR) specifications. In times of highly fluctuating precious metal costs, the use of a minimum of the precious metal ruthenium respectively ruthenium dioxide is one essential part for cost-effectiveness. The thick film paste formulation consists of the electrically conducting phase ruthenium dioxide, a lead-free glass phase and two inorganic additives for tuning thermo-mechanical and electrical properties of the formed films. A phthalate free organic vehicle with ethyl cellulose polymer was used to formulate a screen printable ceramic thick film paste.</jats:p><jats:p>For this paper, RuO2 powders with various specific surface area values (BET) were prepared by thermal annealing of a precipitated fine ruthenium dioxide powder. All other solid and liquid components of the paste were the same as used for IKTS 10 Ω/□ TFR paste FK9611 for AlN substrates. Furthermore, the content of ruthenium dioxide in the paste compositions was changed systematically around an assumed target content to achieve the desired sheet resistivity. Concurrent to the variation of the ruthenium dioxide content the inorganic additives had to be adapted too. The influence of the variations of raw material and paste composition on the film properties were investigated by screen printing 24 resistors of 2 mm × 1 mm dimension on an 1” × 1” AlN substrate, firing at 850 °C for 10 minutes in air atmosphere and subsequently measuring R□, TCR, the stability of resistance ΔR/R0 effected by artificial aging of the resistors (stored 100 up to 1000 hours @ 200°C) and the maximum rated power dissipation (MRPD) as well as short term overload voltage (STOL). The results are discussed in regard to find an optimum between all demands of the most important electrical film properties.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • resistivity
  • phase
  • glass
  • glass
  • aging
  • annealing
  • ceramic
  • cellulose
  • aging
  • Ruthenium