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Arya, Sandeep K.
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article
Band Gap and Conductivity Measurement of TiO<sub>2</sub> Thin Films Deposited by Sol-Gel Spin Coating Method
Abstract
<jats:p>Thin films of TiO<jats:sub>2</jats:sub>have been deposited on to cleaned glass substrate by sol gel spin coating method. The XRD analyses confirm different crystalline phases of TiO<jats:sub>2</jats:sub>thin films. The grain size calculated by the help of Scherer’s formula and found to be 23nm, 37nm and 54 nm respectively for TiO<jats:sub>2</jats:sub>(004), TiO<jats:sub>2</jats:sub>(200) and TiO<jats:sub>2</jats:sub>(211) orientations. The band gap was calculated 3.6 eV by UV-spectrophotometer. The refractive index of the TiO<jats:sub>2</jats:sub>film was measured by Ellipsometry and found to be 2.33. Conductivity was measured using Current voltage (I-V) characteristics. To determine composition and thermal stability, thermo gravimetric Analyzer (TGA) and Differential Scanning Calorimeter (DSC) analysis was made on samples.</jats:p>