Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Goszczak, Arkadiusz Jaroslaw

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University of Southern Denmark

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (3/3 displayed)

  • 2020Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams3citations
  • 2018Single-mode to multi-mode crossover in thin-load polymethyl methacrylate plasmonic waveguidescitations
  • 2016Nanoscale aluminum concaves for light-trapping in organic thin-films3citations

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Adashkevich, Vadzim
1 / 3 shared
Tavares, Luciana
1 / 12 shared
Rubahn, Horst-Günter
3 / 51 shared
Chiriaev, Serguei
1 / 19 shared
Thomaschewski, Martin
1 / 5 shared
Leißner, Till
1 / 13 shared
Fiutowski, Jacek
2 / 27 shared
Bauer, Michael
1 / 12 shared
Sobolewska, Elżbieta Karolina
1 / 1 shared
Großmann, Malte
1 / 3 shared
Klick, Alwin
1 / 6 shared
Adam, Jost
2 / 19 shared
Cielecki, Pawel Piotr
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Madsen, Morten
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2020
2018
2016

Co-Authors (by relevance)

  • Adashkevich, Vadzim
  • Tavares, Luciana
  • Rubahn, Horst-Günter
  • Chiriaev, Serguei
  • Thomaschewski, Martin
  • Leißner, Till
  • Fiutowski, Jacek
  • Bauer, Michael
  • Sobolewska, Elżbieta Karolina
  • Großmann, Malte
  • Klick, Alwin
  • Adam, Jost
  • Cielecki, Pawel Piotr
  • Madsen, Morten
OrganizationsLocationPeople

article

Out-of-plane surface patterning by subsurface processing of polymer substrates with focused ion beams

  • Adashkevich, Vadzim
  • Goszczak, Arkadiusz Jaroslaw
  • Tavares, Luciana
  • Rubahn, Horst-Günter
  • Chiriaev, Serguei
Abstract

This work explores a new technique for the out-of-plane patterning of metal thin films prefabricated on the surface of a polymer substrate. This technique is based on an ion-beam-induced material modification in the bulk of the polymer. Effects of subsurface and surface processes on the surface morphology have been studied for three polymer materials: poly(methyl methacrylate), polycarbonate, and polydimethylsiloxane, by using focused ion beam irradiation with He+, Ne+, and Ga+. Thin films of a Pt60Pd40 alloy and of pristine Au were used to compare the patterning of thin films with different microstructures. We show that the height of Pt60Pd40 thin films deposited onto poly(methyl methacrylate) and polycarbonate substrates can be patterned by He+ ion beams with ultrahigh precision (nanometers) while preserving in-plane features, at the nanoscale, of the pre-deposited films. Ion irradiation of the Au-coated samples results in delamination, bulging, and perforation of the Au film, which is attributed to the accumulation of gases from radiolysis at the film–substrate interface. The irradiation with Ne+ and Ga+ ions destroys the films and roughens the surface due to dominating sputtering processes. A very different behavior, resulting in the formation of complex, multiscale 3D patterns, is observed for polydimethylsiloxane samples. The roles of the metal film structure, elastic properties of the polymer substrate, and irradiation-induced mechanical strain in the patterning process are elaborated and discussed.

Topics
  • impedance spectroscopy
  • microstructure
  • surface
  • polymer
  • thin film
  • focused ion beam