| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Funakubo, Hiroshi
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2022Nanoscale mapping to assess the asymmetry of local C–V curves obtained from ferroelectric materialscitations
- 2019Strain-induced resistance change in V2O3 films on piezoelectric ceramic diskscitations
- 2019Strain-induced resistance change in V 2 O 3 films on piezoelectric ceramic diskscitations
- 2017Direct Imaging of the Relaxation of Individual Ferroelectric Interfaces in a Tensile‐Strained Filmcitations
- 2015Transport properties and c/a ratio of V2O3 thin films grown on C- and R-plane sapphire substrates by pulsed laser depositioncitations
- 2014Chemical and structural effects on ionic conductivity at columnar grain boundaries in yttria-stabilized zirconia thin filmscitations
- 2013Columnar grain boundary coherence in yttria-stabilized zirconia thin film: effects on ionic conductivitycitations
- 2013Unusual 90°domain structure in (2/3)Bi(Zn1/2Ti 1/2)O3-(1/3)BiFeO3 epitaxial films with giant 22% tetragonal distortioncitations
- 2007“Crystal structure and microstructure of epitaxial Pb(Zr,Ti)O3 films consisting of mixed phases with tetragonal and rhombohedral symmetries grown on (100)cSrRuO3//(100)SrTiO3 substrate by metalorganic chemical vapor deposition”
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article
Nanoscale mapping to assess the asymmetry of local C–V curves obtained from ferroelectric materials
Abstract
<jats:title>Abstract</jats:title><jats:p>The asymmetry in the capacitance–voltage (<jats:italic>C</jats:italic>–<jats:italic>V</jats:italic>) curves obtained from a ferroelectric material can provide information concerning the internal microstructure of a specimen. The present study visualized nanoscale switching of a HfO<jats:sub>2</jats:sub>-based ferroelectric thin film in real space based on assessing asymmetry using a local <jats:italic>C</jats:italic>–<jats:italic>V</jats:italic> mapping method. Several parameters were extracted from the local <jats:italic>C</jats:italic>–<jats:italic>V</jats:italic> curves at each point. The parameter <jats:italic>V</jats:italic><jats:sub><jats:italic>i</jats:italic></jats:sub>, indicating the lateral shift of the local <jats:italic>C</jats:italic>–<jats:italic>V</jats:italic> curve, was employed as an indicator of local imprint. In addition, the differences in the areas between the <jats:italic>C</jats:italic>–<jats:italic>V</jats:italic> curves for the forward and reverse sweeps, <jats:italic>S</jats:italic><jats:sub>f</jats:sub> − <jats:italic>S</jats:italic><jats:sub>r</jats:sub>, provided another slightly different indicator of nanoscale switching asymmetry. These parameters obtained from asymmetric <jats:italic>C</jats:italic>–<jats:italic>V</jats:italic> curves are thought to be related to internal electric fields and local stress caused by defects in the film. The work reported here also involved a cluster analysis of the extracted parameters using the <jats:italic>k</jats:italic>-means method.</jats:p>