Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Kuhn, Harald

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2024Hot Embossing to Fabricate Parylene-Based Microstructures and Its Impact on the Material Propertiescitations
  • 2022Static High Voltage Actuation of Piezoelectric AlN and AlScN Based Scanning Micromirrors8citations
  • 2022Localized Induction Heating of Cu-Sn Layers for Rapid Solid-Liquid Interdiffusion Bonding Based on Miniaturized Coils2citations
  • 2021Design and technology for uniform aluminum nitride piezoelectric micromachined ultrasonic transducers with radial array2citations
  • 20202D Scanning Micromirror with Large Scan Angle and Monolithically Integrated Angle Sensors Based on Piezoelectric Thin Film Aluminum Nitride29citations

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Chart of shared publication
Joseph, Yvonne
1 / 6 shared
Schneider, Marc
1 / 11 shared
Guttmann, Markus
1 / 11 shared
Glauche, Florian
1 / 1 shared
Selbmann, Franz
1 / 3 shared
Hengsbach, Stefan
1 / 2 shared
Hiller, Karla
3 / 7 shared
Forke, Roman
3 / 4 shared
Žukauskaitė, Agnė
1 / 7 shared
Stoeckel, Chris
2 / 2 shared
Meinel, Katja
2 / 3 shared
Melzer, Marcel
3 / 7 shared
Zimmermann, Sven
3 / 9 shared
Hofmann, Christian
1 / 3 shared
Kroll, Martin
1 / 8 shared
Panhale, Sushant
1 / 1 shared
Rochala, Patrick
1 / 2 shared
Wiemer, Maik
1 / 6 shared
Satwara, Maulik
1 / 1 shared
Otto, Thomas
2 / 16 shared
Tavakolibasti, M.
1 / 1 shared
Stöckel, Chris
1 / 3 shared
Shaporin, Alexey
1 / 2 shared
Meinel, Katja Sarah
1 / 1 shared
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2022
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Co-Authors (by relevance)

  • Joseph, Yvonne
  • Schneider, Marc
  • Guttmann, Markus
  • Glauche, Florian
  • Selbmann, Franz
  • Hengsbach, Stefan
  • Hiller, Karla
  • Forke, Roman
  • Žukauskaitė, Agnė
  • Stoeckel, Chris
  • Meinel, Katja
  • Melzer, Marcel
  • Zimmermann, Sven
  • Hofmann, Christian
  • Kroll, Martin
  • Panhale, Sushant
  • Rochala, Patrick
  • Wiemer, Maik
  • Satwara, Maulik
  • Otto, Thomas
  • Tavakolibasti, M.
  • Stöckel, Chris
  • Shaporin, Alexey
  • Meinel, Katja Sarah
OrganizationsLocationPeople

article

2D Scanning Micromirror with Large Scan Angle and Monolithically Integrated Angle Sensors Based on Piezoelectric Thin Film Aluminum Nitride

  • Otto, Thomas
  • Hiller, Karla
  • Forke, Roman
  • Shaporin, Alexey
  • Kuhn, Harald
  • Stoeckel, Chris
  • Meinel, Katja Sarah
  • Melzer, Marcel
  • Zimmermann, Sven
Abstract

<jats:p>A 2D scanning micromirror with piezoelectric thin film aluminum nitride (AlN), separately used as actuator and sensor material, is presented. For endoscopic applications, such as fluorescence microscopy, the devices have a mirror plate diameter of 0.7 mm with a 4 mm2 chip footprint. After an initial design optimization procedure, two micromirror designs were realized. Different spring parameters for x- and y-tilt were chosen to generate spiral (Design 1) or Lissajous (Design 2) scan patterns. An additional layout, with integrated tilt angle sensors, was introduced (Design 1-S) to enable a closed-loop control. The micromirror devices were monolithically fabricated in 150 mm silicon-on-insulator (SOI) technology. Si (111) was used as the device silicon layer to support a high C-axis oriented growth of AlN. The fabricated micromirror devices were characterized in terms of their scanning and sensor characteristics in air. A scan angle of 91.2° was reached for Design 1 at 13 834 Hz and 50 V. For Design 2 a scan angle of 92.4° at 12 060 Hz, and 123.9° at 13 145 Hz, was reached at 50 V for the x- and y-axis, respectively. The desired 2D scan patterns were successfully generated. A sensor angle sensitivity of 1.9 pC/° was achieved.</jats:p>

Topics
  • impedance spectroscopy
  • thin film
  • aluminium
  • nitride
  • Silicon
  • fluorescence microscopy