| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Kozlovskiy, Artem
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (12/12 displayed)
- 2024Investigation of the Phase Composition, Structural, Mechanical, and Dielectric Properties of (1 − x)∙ZrO2-x∙CeO2 Ceramics Synthesized by the Solid-State Methodcitations
- 2023Study of the Effect of Adding Nb2O5 on Calcium Titanate-Based Ferroelectric Ceramicscitations
- 2023Study of β-Ga2O3 Ceramics Synthesized under Powerful Electron Beamcitations
- 2023Study of the Structural, Electrical, and Mechanical Properties and Morphological Features of Y-Doped CeO2 Ceramics with Porous Structurecitations
- 2023Study of the Kinetics of Radiation Damage in CeO2 Ceramics upon Irradiation with Heavy Ionscitations
- 2023Effects of Structural Radiation Disorder in the Near-Surface Layer of Alloys Based on NbTiVZr Compounds Depending on the Variation of Alloy Componentscitations
- 2023Study of the Aid Effect of CuO-TiO2-Nb2O5 on the Dielectric and Structural Properties of Alumina Ceramicscitations
- 2023Structural, Dielectric, and Mechanical Properties of High-Content Cubic Zirconia Ceramics Obtained via Solid-State Synthesiscitations
- 2022Properties of Perovskite-like Lanthanum Strontium Ferrite Ceramics with Variation in Lanthanum Concentrationcitations
- 2022Study of the Applicability of Magnetic Iron-Containing Nanoparticles in Hyperthermia and Determination of Their Resistance to Degradation Processescitations
- 2022Application of UV-Vis Optical Spectroscopy and X-ray Diffraction Methods to Describe the Effect of Alpha-Emitting Radionuclides (Radon) When They Are Detected by Solid-State Film Detectorscitations
- 2022Study of Phase Transformations and Hyperfine Interactions in Fe3O4 and Fe3O4@Au Nanoparticlescitations
Places of action
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article
Application of UV-Vis Optical Spectroscopy and X-ray Diffraction Methods to Describe the Effect of Alpha-Emitting Radionuclides (Radon) When They Are Detected by Solid-State Film Detectors
Abstract
<jats:p>This work aims to evaluate the application of optical and X-ray spectroscopy methods to determine the effect of alpha-emitting radionuclides on the properties of solid-state nuclear track detectors (SSNTD) based on nitrocellulose during their detection. The proposed estimation methods are alternative methods to standard technologies, making it possible to determine the concentration of radon and its decay products without the chemical etching of film detectors and subsequent direct counting of the formed latent tracks from interacting particles. During the research, it was found that the use of optical spectroscopy and X-ray diffraction methods makes it possible to qualitatively determine the irradiation effect on changes in the properties of film detectors when α-particles with different energies pass through them. At the same time, a comparison of the data of optical spectroscopy, X-ray diffraction and the visualization of latent tracks after chemical etching made it possible to establish that a part of the registered α-particles in living quarters has an energy of less than 2.5 MeV, which is not enough to pass through the polymer film of the detector, as a result of which well-like tracks are formed. An increase in the intensity of the interference bands in the region above 700 nm and a decrease in the intensity of diffraction reflection characterized the changes in optical transmission. The penetration of the α-particles through the detecting film decreases the film’s transmission capacity, forming an anisotropic change in diffraction reflections associated with a change in the film’s structure and defective fractions distorting the molecular structure.</jats:p>