• Ludwig, Tim

Abstract

<jats:p>This study was dedicated to the investigation of poly(vinylidene fluoride) (PVDF) micropillar arrays obtained by soft lithography followed by phase inversion at a low temperature. Reduced graphene oxide (rGO) was incorporated into the PVDF as a nucleating filler. The piezoelectric properties of the PVDF-rGO composite micropillars were explored via piezo-response force microscopy (PFM). Fourier transform infrared spectroscopy (FTIR) and X-ray diffraction (XRD) showed that α, β, and γ phases co-existed in all studied samples, with a predominance of the γ phase. The piezoresponse force microscopy (PFM) data provided the local piezoelectric response of the PVDF micropillars, which exhibited a temperature-induced downward dipole orientation in the pristine PVDF micropillars. The addition of rGO into the PVDF matrix resulted in a change in the preferred polarization direction, and the piezo-response phase angle changed from −120° to 20°–40°. The pristine PVDF and PVDF loaded with 0.1 wt % of rGO after low-temperature quenching were found to possess a piezoelectric response of 86 and 87 pm/V respectively, which are significantly higher than the |d33eff| in the case of imprinted PVDF 64 pm/V. Thus, the addition of rGO significantly affected the domain orientation (polarization) while quenching increased the piezoelectric response.</jats:p>

Topics

• phase
• x-ray diffraction
• composite
• Fourier transform infrared spectroscopy
• lithography
• quenching
• microscopy