Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (4/4 displayed)

  • 2024Direct growth of highly oriented GaN thin films on silicon by remote plasma CVD2citations
  • 2023Reactive plasma sputtering deposition of polycrystalline GaN thin films on silicon substrates at room temperature5citations
  • 2023Liquid Shear Exfoliation of MoS2: Preparation, Characterization, and NO2-Sensing Properties12citations
  • 2016Charge transport and contact resistance in coplanar devices based on colloidal polyaniline dispersion4citations

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Chart of shared publication
Johnson, Erik V.
1 / 3 shared
Bulkin, Pavel
1 / 4 shared
Muller, Dominique
1 / 9 shared
Jadaud, Cyril
2 / 2 shared
Ouaras, Karim
2 / 7 shared
Silva, François
2 / 2 shared
Watrin, Lise
1 / 1 shared
Pere, Roca I. Cabarrocas
2 / 22 shared
Johnson, Erik
1 / 14 shared
Srinivasan, Lakshman
1 / 4 shared
Maurice, Jean-Luc
1 / 15 shared
Ni, Pingping
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Bouanis, Fatima
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Florea, Ileana
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Yassar, Abderrahim
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Dieng, Mbaye
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Bonnassieux, Yvan
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Stejskal, Jaroslav
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Tondelier, Denis
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Mencaraglia, Denis
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Peřinka, N.
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Hajná, M.
1 / 4 shared
Masillamani, Appan Merari
1 / 1 shared
Geffroy, Bernard
1 / 25 shared
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2024
2023
2016

Co-Authors (by relevance)

  • Johnson, Erik V.
  • Bulkin, Pavel
  • Muller, Dominique
  • Jadaud, Cyril
  • Ouaras, Karim
  • Silva, François
  • Watrin, Lise
  • Pere, Roca I. Cabarrocas
  • Johnson, Erik
  • Srinivasan, Lakshman
  • Maurice, Jean-Luc
  • Ni, Pingping
  • Bouanis, Fatima
  • Florea, Ileana
  • Yassar, Abderrahim
  • Dieng, Mbaye
  • Bonnassieux, Yvan
  • Stejskal, Jaroslav
  • Tondelier, Denis
  • Mencaraglia, Denis
  • Peřinka, N.
  • Hajná, M.
  • Masillamani, Appan Merari
  • Geffroy, Bernard
OrganizationsLocationPeople

article

Liquid Shear Exfoliation of MoS2: Preparation, Characterization, and NO2-Sensing Properties

  • Ni, Pingping
  • Bouanis, Fatima
  • Florea, Ileana
  • Yassar, Abderrahim
  • Vanel, Jean-Charles
  • Dieng, Mbaye
Abstract

<jats:p>2D materials possess great potential to serve as gas-sensing materials due to their large, specific surface areas and strong surface activities. Among this family, transition metal chalcogenide materials exhibit different properties and are promising candidates for a wide range of applications, including sensors, photodetectors, energy conversion, and energy storage. Herein, a high-shear mixing method has been used to produce multilayered MoS2 nanosheet dispersions. MoS2 thin films were manufactured by vacuum-assisted filtration. The structural morphology of MoS2 was studied using ς-potential, UV–visible, scanning electron microscopy (SEM), atomic force microscopy (AFM), energy-dispersive X-ray spectroscopy (EDX), transmission electron microscopy (TEM), X-ray diffraction (XRD), and Raman spectroscopy (RS). The spectroscopic and microscopic analyses confirm the formation of a high-crystalline MoS2 thin film with good inter-sheet connectivity and relative thickness uniformity. The thickness of the MoS2 layer is measured to be approximately 250 nm, with a nanosheet size of 120 nm ± 40 nm and a number of layers between 6 and 9 layers. Moreover, the electrical characteristics clearly showed that the MoS2 thin film exhibits good conductivity and a linear I–V curve response, indicating good ohmic contact between the MoS2 film and the electrodes. As an example of applicability, we fabricated chemiresistive sensor devices with a MoS2 film as a sensing layer. The performance of the MoS2-chemiresistive sensor for NO2 was assessed by being exposed to different concentrations of NO2 (1 ppm to 10 ppm). This sensor shows a sensibility to low concentrations of 1 ppm, with a response time of 114 s and a recovery time of 420 s. The effect of thin-film thickness and operating temperatures on sensor response was studied. The results show that thinner film exhibits a higher response to NO2; the response decreases as the working temperature increases.</jats:p>

Topics
  • impedance spectroscopy
  • dispersion
  • surface
  • scanning electron microscopy
  • x-ray diffraction
  • thin film
  • atomic force microscopy
  • transmission electron microscopy
  • Energy-dispersive X-ray spectroscopy
  • Raman spectroscopy