Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2022Effects of Heavy Ion Irradiation on the Thermoelectric Properties of In2(Te1−xSex)3 Thin Films7citations

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Pandian, Mannu
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Krishnaprasanth, Alageshwaramoorthy
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Dong, Chung-Li
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Palanisamy, Matheswaran
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Meena, Ramcharan
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2022

Co-Authors (by relevance)

  • Pandian, Mannu
  • Krishnaprasanth, Alageshwaramoorthy
  • Dong, Chung-Li
  • Palanisamy, Matheswaran
  • Meena, Ramcharan
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article

Effects of Heavy Ion Irradiation on the Thermoelectric Properties of In2(Te1−xSex)3 Thin Films

  • Pandian, Mannu
  • Krishnaprasanth, Alageshwaramoorthy
  • Dong, Chung-Li
  • Bangaru, Gokul
  • Palanisamy, Matheswaran
  • Meena, Ramcharan
Abstract

<jats:p>Ion irradiation is an exceptionally effective approach to induce controlled surface modification/defects in semiconducting thin films. In this investigation, ion-irradiated Se–Te-based compounds exhibit electrical transport properties that greatly favor the transformation of waste heat into electricity. Enhancements of both the Seebeck coefficient (S) and the power factor (PF) of In2(Te0.98Se0.02)3 films under 120 MeV Ni9+ ion irradiation were examined. The maximum S value of the pristine film was about ~221 µVK−1. A significantly higher S value of about ~427 µVK−1 was obtained following irradiation at 1 × 1013 ions/cm2. The observed S values suggest the n-type conductivity of these films, in agreement with Hall measurements. Additionally, Ni ion irradiation increased the PF from ~1.23 to 4.91 µW/K2m, demonstrating that the irradiated films outperformed the pristine samples. This enhancement in the TE performance of the In2(Te0.98Se0.02)3 system is elucidated by irradiation-induced effects that are revealed by structural and morphological studies.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • compound
  • thin film
  • defect