Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (5/5 displayed)

  • 2024Degradable polycaprolactone/buffer composites as pH regulating carrier materials for drug delivery and 3D printed biomaterials3citations
  • 2023Effects of Gamma Irradiation and Supercritical Carbon Dioxide Sterilization on Methacrylated Gelatin/Hyaluronan Hydrogels5citations
  • 2020Matrix Decomposition of Carbon-Fiber-Reinforced Plastics via the Activation of Semiconductors3citations
  • 2019Ultrashort Pulsed Laser Surface Patterning of Titanium to Improve Osseointegration of Dental Implants42citations
  • 2019Ultrashort Pulsed Laser Surface Patterning of Titanium to Improve Osseointegration of Dental Implants42citations

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Hannig, Christian
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Wiesmann, Hans Peter
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Alt, Franziska
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Wiesmann, Hans-Peter
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Co-Authors (by relevance)

  • Hannig, Christian
  • Wiesmann, Hans Peter
  • Sterzenbach, Torsten
  • Alt, Franziska
  • Guder, Celine
  • Schüler, Therese
  • Lorenz, Katrin
  • Wiesmann, Hans-Peter
  • Buchner, Frauke
  • Lee, Poh Soo
  • Hintze, Vera
  • Bernhardt, Anne
  • Heinemann, Christiane
  • Kruppke, Iris
  • Gereke, Thomas
  • Cherif, Chokri
  • Richter, Mirko
  • Böhnke, Philippa Ruth Christine
  • Häntzsche, Eric Martin
  • Rabe, David
  • Lasagni, Andrés Fabián
  • Zwahr, Christoph
  • Gulow, Nikolai
  • Welle, Alexander
  • Weingärtner, Tobias
  • Holthaus, Marzellus Große
  • Große Holthaus, Marzellus
  • Lasagni, Andrés-Fabián
OrganizationsLocationPeople

article

Matrix Decomposition of Carbon-Fiber-Reinforced Plastics via the Activation of Semiconductors

  • Kruppke, Iris
  • Gereke, Thomas
  • Cherif, Chokri
  • Richter, Mirko
  • Kruppke, Benjamin
  • Böhnke, Philippa Ruth Christine
  • Häntzsche, Eric Martin
  • Rabe, David
Abstract

<p>The present study proposed a novel process for the matrix decomposition of carbon-fiber-reinforced plastics (CFRPs). For this purpose, the influence of ultraviolet (UV) radiation paired with semiconductors on CFRP was analyzed. Then, suitable process parameters for superficial and in-depth matrix decomposition in CFRP were evaluated. The epoxy resin was decomposed most effectively without damaging the embedded carbon fiber by using a UV light-emitting diode (LED) spotlight (395 nm, Semray 4103 by Heraeus Noblelight) at a power level of 66% compared to the maximum power of the spotlight. Using a distance of 10 mm and a treatment duration of only 35-40 s achieved a depth of two layers with an area of 750 mm<sup>2</sup>, which is suitable for technological CFRP repair procedures. In addition to the characterization of the process, the treated CFRP samples were analyzed based on several analytical methods, namely, light microscopy (LM), scanning electron microscopy (SEM), and atomic force microscopy (AFM). Subsequently, the prepared carbon fibers (CFs) were tested using filament tensiometry, single filament tensile tests, and thermogravimetric measurements. All analyses showed the power level of 66% to be superior to the use of 96% power. The gentle ("fiber friendly") matrix destruction reduced the damage to the surface of the fibers and maintained their properties, such as maximum elongation and maximum tensile strength, at the level of the reference materials.</p>

Topics
  • impedance spectroscopy
  • surface
  • polymer
  • Carbon
  • scanning electron microscopy
  • atomic force microscopy
  • semiconductor
  • strength
  • activation
  • tensile strength
  • resin
  • decomposition
  • tensiometry