Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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RWTH Aachen University

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (6/6 displayed)

  • 2023Compositional defects in a MoAlB MAB phase thin film grown by high-power pulsed magnetron sputtering4citations
  • 2023Ion kinetic energy- and ion flux-dependent mechanical properties and thermal stability of (Ti,Al)N thin films18citations
  • 2023Ion kinetic energy- and ion flux-dependent mechanical properties and thermal stability of (Ti,Al)N thin films18citations
  • 2020Kinetically Limited Phase Formation of Pt-Ir Based Compositionally Complex Thin Films5citations
  • 2019Quantenchemische Untersuchungen der Nahordnungseffekte und etwaiger Fehlordnung in κ-Karbidencitations
  • 2018On the Mn–C Short-Range Ordering in a High-Strength High-Ductility Steel: Small Angle Neutron Scattering and Ab Initio Investigation19citations

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Schneider, Jochen M.
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Achenbach, Jan-Ole
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Hans, Marcus
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Primetzhofer, Daniel
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Music, Denis
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Co-Authors (by relevance)

  • Schneider, Jochen M.
  • Sahu, Rajib
  • Achenbach, Jan-Ole
  • Hans, Marcus
  • Primetzhofer, Daniel
  • Scheu, Christina
  • Unutulmazsoy, Yeliz
  • Fidanboy, Gönenç
  • Holzapfel, Damian M.
  • Anders, André
  • Aghda, Soheil Karimi
  • Méndez, Alba San José
  • Mráz, Stanislav
  • Music, Denis
  • Karimi Aghda, Soheil
  • Saksena, Aparna
  • Song, Wenwen
  • Houston, Judith
  • Dronskowski, Richard
  • Yildiz, Ahmet
  • Bleck, Wolfgang
OrganizationsLocationPeople

article

Kinetically Limited Phase Formation of Pt-Ir Based Compositionally Complex Thin Films

  • Schneider, Jochen M.
  • Saksena, Aparna
  • Bogdanovski, Dimitri
  • Music, Denis
Abstract

<jats:p>The phase formation of PtIrCuAuX (X = Ag, Pd) compositionally complex thin films is investigated to critically appraise the criteria employed to predict the formation of high entropy alloys. The formation of a single-phase high entropy alloy is predicted if the following requirements are fulfilled: 12 J∙K−1 mol−1 ≤ configurational entropy ≤ 17.5 J∙K−1 mol−1, −10 kJ∙mol−1 ≤ enthalpy of mixing ≤ 5 kJ∙mol−1 and atomic size difference ≤ 5%. Equiatomic PtIrCuAuX (X = Ag, Pd) fulfill all of these requirements. Based on X-ray diffraction and energy-dispersive X-ray spectroscopy data, near-equiatomic Pt22Ir23Cu18Au18Pd19 thin films form a single-phase solid solution while near-equiatomic Pt22Ir23Cu20Au17Ag18 thin films exhibit the formation of two phases. The latter observation is clearly in conflict with the design rules for high entropy alloys. However, the observed phase formation can be rationalized by considering bond strengths and differences in activation energy barriers for surface diffusion. Integrated crystal orbital Hamilton population values per bond imply a decrease in bond strength for all the interactions when Pd is substituted by Ag in PtIrCuAuX which lowers the surface diffusion activation energy barrier by 35% on average for each constituent. This enables the surface diffusion-mediated formation of two phases, one rich in Au and Ag and a second phase enriched in Pt and Cu. Hence, phase formation in these systems appears to be governed by the complex interplay between energetics and kinetic limitations rather than by configurational entropy.</jats:p>

Topics
  • impedance spectroscopy
  • surface
  • phase
  • x-ray diffraction
  • thin film
  • strength
  • activation
  • Energy-dispersive X-ray spectroscopy