Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023An Automatic Apparatus for Simultaneous Measurement of Seebeck Coefficient and Electrical Resistivity8citations

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Xiong, Ruifeng
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Pakdel, Amir
1 / 11 shared
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2023

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  • Xiong, Ruifeng
  • Pakdel, Amir
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article

An Automatic Apparatus for Simultaneous Measurement of Seebeck Coefficient and Electrical Resistivity

  • Xiong, Ruifeng
  • Pakdel, Amir
  • Masoumi, Saeed
Abstract

<jats:p>A fully automated experimental system was designed for simultaneous measurement of the Seebeck coefficient and electrical resistivity of thermoelectric materials in bulk form. The system incorporates a straightforward and easily fabricated sample holder along with commercially available electronic instrument components. The sample holder showcases a compact design that utilizes two Peltier module heaters to induce sample heating and generate the required temperature gradient. System automation and control are achieved through the implementation of a LabView program. The Seebeck voltage and resistance of the sample (under specified temperature conditions) are determined using I–V measurements. The Seebeck voltage and resistance of the sample correspond to the intercept and slope of the I–V characteristic diagram in the four-point probe method, respectively. To verify the accuracy and reliability of the developed apparatus, a variety of experiments were performed on N-type and P-type bismuth telluride samples. The measurement results closely matched those obtained from commercial systems, with an overall data difference of less than 10% for both the Seebeck coefficient and resistivity measurements.</jats:p>

Topics
  • resistivity
  • experiment
  • laser emission spectroscopy
  • Bismuth