• Basu, Indranil
• Fidder, Herman
• Ocelík, Václav
• Hosson, Jeff Th. M. De

Abstract

<p>The current work implements a correlative microscopy method utilizing electron back scatter diffraction, focused ion beam and digital image correlation to accurately determine spatially resolved stress profiles in the vicinity of grain/twin boundaries and tensile deformation twin tips in commercially pure titanium. Measured local stress gradients were in good agreement with local misorientation values. The role of dislocation-boundary interactions on the buildup of local stress gradients is elucidated. Stress gradients across the twin-parent interface were compressive in nature with a maximum stress magnitude at the twin boundary. Stress profiles near certain grain boundaries initially display a local stress minimum, followed by a typically observed “one over square root of distance” variation, as was first postulated by Eshelby, Frank and Nabarro. The observed trends allude to local stress relaxation mechanisms very close to the grain boundaries. Stress states in front of twin tips showed tensile stress gradients, whereas the stress state inside the twin underwent a sign reversal. The findings highlight the important role of deformation twins and their corresponding interaction with grain boundaries on damage nucleation in metals.</p>

Topics

• impedance spectroscopy
• grain
• focused ion beam
• dislocation
• titanium
• microscopy
• commercially pure titanium
• twin boundary