• Berthebaud, David
• Mori, Takao
• Tonquesse, Sylvain Le
• Matsushita, Yoshitaka

Abstract

<jats:p>CrSi2 is a promising thermoelectric material constituted of non-toxic and earth abundant elements that offer good perspectives for the mass production of inexpensive and reliable thermoelectric modules for waste heat recovery. Realization of robust metallic contacts with low electrical and thermal resistances on thermoelectric materials is crucial to maximize the conversion efficiency of such a device. In this article, the metallization of an undoped CrSi2 with Ti and Nb using a conventional Spark Plasma Sintering process is explored and discussed. These contact metals were selected because they have compatible thermal expansion coefficients with those of CrSi2, which were determined in this study by X-ray Diffraction in the temperature range 299–899 K. Ti was found to be a promising contact metal offering both strong adhesion on CrSi2 and negligible electrical contact resistance (&lt;1 μΩ cm2). However, metallization with Nb resulted in the formation of cracks caused by large internal stress inside the sample during the fabrication process and the diffusion of Si in the metallic layer. A maximum conversion efficiency of 0.3% was measured for a sandwiched Ti/CrSi2/Ti thermoelectric leg placed inside a thermal gradient of 427 K. The preliminary results obtained and discussed in this article on a relatively simple case study aim to initiate the development of more reliable and efficient CrSi2 thermoelectric legs with an optimized design.</jats:p>

Topics

• impedance spectroscopy
• x-ray diffraction
• crack
• thermal expansion
• sintering