Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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Paul, Pallabi

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Ferdinand-Braun-Institut

in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (8/8 displayed)

  • 2023Development and properties of all-dielectric and metal-dielectric heterostructures at atomic scalecitations
  • 2023Conformal antireflection coatings for optical dome covers by atomic layer depositioncitations
  • 2023Heterostructure Films of SiO 2 and HfO 2 for High-Power Laser Optics Prepared by Plasma-Enhanced Atomic Layer Deposition9citations
  • 2023Heterostructure Films of SiO2 and HfO2 for High-Power Laser Optics Prepared by Plasma-Enhanced Atomic Layer Deposition9citations
  • 2023Linear and Nonlinear Optical Properties of Iridium Nanoparticles Grown via Atomic Layer Deposition8citations
  • 2022Linear and Nonlinear Optical Properties of Iridium Nanoparticles by Atomic Layer depositioncitations
  • 2021Influence of substrate materials on nucleation and properties of iridium thin films grown by ALD31citations
  • 2020Antireflection Coating on PMMA Substrates by Atomic Layer Deposition28citations

Places of action

Chart of shared publication
Kästner, David
1 / 1 shared
Beladiya, Vivek
4 / 9 shared
Niiranen, Kalle
1 / 1 shared
Schröder, Sven
4 / 9 shared
Szeghalmi, Adriana V.
3 / 3 shared
Saarniheimo, Mikael
1 / 1 shared
Gerold, Kristin
1 / 1 shared
Nolte, Stefan
2 / 7 shared
Szeghalmi, Adriana
3 / 13 shared
Matthäus, Gabor
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Riese, Sebastian
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Alam, Shawon
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Gottwald, Alexander
2 / 4 shared
Trost, Marcus
2 / 2 shared
Fritz, Torsten
3 / 15 shared
Otto, Felix
3 / 13 shared
Schmitt, Paul
5 / 10 shared
Mühlig, Christian
2 / 4 shared
Wilbrandt, Steffen
2 / 2 shared
Stenzel, Olaf
2 / 2 shared
Li, Weiwei
2 / 15 shared
Hanemann, Kevin
2 / 2 shared
Munser, Anne-Sophie
2 / 4 shared
Felde, Nadja
3 / 3 shared
Kling, Matthias F.
2 / 2 shared
David, Christin
2 / 2 shared
Tünnermann, Andreas
2 / 16 shared
Daryakar, Navid
2 / 2 shared
Wang, Zilong
2 / 2 shared
Tuennermann, Andreas
1 / 1 shared
Schroeder, Sven
1 / 1 shared
Chart of publication period
2023
2022
2021
2020

Co-Authors (by relevance)

  • Kästner, David
  • Beladiya, Vivek
  • Niiranen, Kalle
  • Schröder, Sven
  • Szeghalmi, Adriana V.
  • Saarniheimo, Mikael
  • Gerold, Kristin
  • Nolte, Stefan
  • Szeghalmi, Adriana
  • Matthäus, Gabor
  • Riese, Sebastian
  • Alam, Shawon
  • Gottwald, Alexander
  • Trost, Marcus
  • Fritz, Torsten
  • Otto, Felix
  • Schmitt, Paul
  • Mühlig, Christian
  • Wilbrandt, Steffen
  • Stenzel, Olaf
  • Li, Weiwei
  • Hanemann, Kevin
  • Munser, Anne-Sophie
  • Felde, Nadja
  • Kling, Matthias F.
  • David, Christin
  • Tünnermann, Andreas
  • Daryakar, Navid
  • Wang, Zilong
  • Tuennermann, Andreas
  • Schroeder, Sven
OrganizationsLocationPeople

article

Antireflection Coating on PMMA Substrates by Atomic Layer Deposition

  • Paul, Pallabi
Abstract

<jats:p>Antireflection coatings (ARC) are essential for various optical components including such made of plastics for high volume applications. However, precision coatings on plastics are rather challenging due to typically low adhesion of the coating to the substrate. In this work, optimization of the atomic layer deposition (ALD) processes towards conformal optical thin films of Al2O3, TiO2 and SiO2 on poly(methyl methacrylate) (PMMA) has been carried out and a five-layer ARC is demonstrated. While the uncoated PMMA substrates have a reflectance of nearly 8% in the visible (VIS) spectral range, this is reduced below 1.2% for the spectral range of 420–670 nm by applying a double-side ARC. The total average reflectance is 0.7%. The optimized ALD coatings show a good adhesion to the PMMA substrates even after the climate test. Microscopic analysis on the cross-hatch areas on PMMA after the climate test indicates very good environmental stability of the ALD coatings. These results enable a possible route by ALD to deposit uniform, crack free, adhesive and environmentally durable thin film layers on sensitive thermoplastics like PMMA.</jats:p>

Topics
  • impedance spectroscopy
  • thin film
  • crack
  • thermoplastic
  • atomic layer deposition