• Zechner, Johannes
• Moser, Sebastian
• Kubicek, Sabine
• Kleinbichler, Manuel
• Cordill, Megan J.

Abstract

<jats:p>In many applications, voids in metals are observed as early degradation features caused by fatigue. In this publication, electropolishing is presented in the context of a novel sample preparation method that is capable of accessing voids in the interior of metal thin films along their lateral direction by material removal. When performed at optimized process parameters, material removal can be well controlled and the surface becomes smooth at the micro scale, resulting in the voids being well distinguishable from the background in scanning electron microscopy images. Compared to conventional cross-sectional sample preparation (embedded mechanical cross-section or focused ion beam), the accessed surface is not constrained by the thickness of the investigated film and laterally resolved void analyses are possible. For demonstrational purposes of this method, the distribution of degradation voids along the metallization of thermo-mechanically stressed microelectronic chips has been quantified.</jats:p>

Topics

• impedance spectroscopy
• surface
• scanning electron microscopy
• thin film
• fatigue
• focused ion beam
• void