• Iii, Carl E. Krill
• Wang, Mingyan
• Furat, Orkun
• Petrich, Lukas
• Schmidt, Volker

Abstract

<jats:p>The curvature of grain boundaries in polycrystalline materials is an important characteristic, since it plays a key role in phenomena like grain growth. However, most traditional tessellation models that are used for modeling the microstructure morphology of these materials, e.g., Voronoi or Laguerre tessellations, have flat faces and thus fail to incorporate the curvature of the latter. For this reason, we consider generalizations of Laguerre tessellations—variations of so-called generalized balanced power diagrams (GBPDs)—that exhibit non-convex cells. With as many as ten parameters for each cell, it is computationally demanding to fit GBPDs to three-dimensional image data containing hundreds of grains. We therefore propose a modification of the traditional definition of GBDPs that allows gradient-based optimization methods to be employed. The resulting reduction in runtime makes it feasible to find approximations to real experimental datasets. We demonstrate this on a three-dimensional x-ray diffraction (3DXRD) mapping of an AlCu alloy, but we also evaluate the modeling errors for simulated data. Furthermore, we investigate the effect of noisy image data and whether the smoothing of image data prior to the fitting step is advantageous.</jats:p>

Topics

• impedance spectroscopy
• morphology
• grain
• x-ray diffraction
• grain growth