Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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Materials Map under construction

The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (1/1 displayed)

  • 2023SiC MOSFET Micro-Explosion Due to a Single Event Burnout : Analysis at the Device and Die Levelscitations

Places of action

Chart of shared publication
Rosine, Coq Germanicus
1 / 1 shared
Kimmo, Niskanen
1 / 1 shared
Sandrine, Froissart
1 / 1 shared
Tanguy, Phulpin
1 / 1 shared
Ulrike, Lüders
1 / 1 shared
Olivier, Latry
1 / 1 shared
Rogaume, Thomas
1 / 9 shared
Chart of publication period
2023

Co-Authors (by relevance)

  • Rosine, Coq Germanicus
  • Kimmo, Niskanen
  • Sandrine, Froissart
  • Tanguy, Phulpin
  • Ulrike, Lüders
  • Olivier, Latry
  • Rogaume, Thomas
OrganizationsLocationPeople

document

SiC MOSFET Micro-Explosion Due to a Single Event Burnout : Analysis at the Device and Die Levels

  • Rosine, Coq Germanicus
  • Kimmo, Niskanen
  • Sandrine, Froissart
  • Tanguy, Phulpin
  • Ulrike, Lüders
  • Olivier, Latry
  • Alain, Michez
  • Rogaume, Thomas
Abstract

Coq Germanicus, R., Phulpin, T., Rogaume, T., Niskanen, K., Froissart, S., Latry, O., Michez, A., & Lüders, U. (2023). SiC MOSFET Micro-Explosion Due to a Single Event Burnout : Analysis at the Device and Die Levels.In ISTFA 2023 : Conference Proceedings from the 49th International Symposium for Testing and Failure Analysis (pp. 483-490). ASM International. https://doi.org/10.31399/asm.cp.istfa2023p0483

Topics