| People | Locations | Statistics |
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| Naji, M. |
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| Motta, Antonella |
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| Aletan, Dirar |
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| Mohamed, Tarek |
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| Ertürk, Emre |
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| Taccardi, Nicola |
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| Kononenko, Denys |
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| Petrov, R. H. | Madrid |
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| Alshaaer, Mazen | Brussels |
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| Bih, L. |
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| Casati, R. |
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| Muller, Hermance |
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| Kočí, Jan | Prague |
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| Šuljagić, Marija |
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| Kalteremidou, Kalliopi-Artemi | Brussels |
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| Azam, Siraj |
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| Ospanova, Alyiya |
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| Blanpain, Bart |
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| Ali, M. A. |
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| Popa, V. |
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| Rančić, M. |
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| Ollier, Nadège |
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| Azevedo, Nuno Monteiro |
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| Landes, Michael |
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| Rignanese, Gian-Marco |
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Rossi, Marco
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (19/19 displayed)
- 2025Study of the Interplay Among Melt Morphology, Rheology and 3D Printability of Poly(Lactic Acid)/Poly(3-Hydroxybutyrate-Co-3-Hydroxyvalerate) Blendscitations
- 2024Magnetic CuFe2O4 Nanoparticles Immobilized on Modified Rice Husk-Derived Zeolite for Chlorogenic Acid Adsorptioncitations
- 2024Correlative analysis of advanced microscopy techniques for metallography and corrosion microstructures of bronze phoenician coinscitations
- 2024Comparative Studies on Nanocellulose as a Bio-Based Consolidating Agent for Ancient Woodcitations
- 2024CMC and Sodium Alginate as novel water-soluble binders for NMC cathodes
- 2023Multimodal and multiscale investigation for the optimization of AlSi10Mg components made by powder bed fusion-laser beamcitations
- 2023Exploring the infiltrative and degradative ability of Fusarium oxysporum on polyethylene terephthalate (PET) using correlative microscopy and deep learningcitations
- 2023Correlative Light and Electron Microscopy (CLEM): A Multifaceted Tool for the Study of Geological Specimenscitations
- 2023A Multiscale and Multimodal Correlative Microscopy Workflow to Characterize Copper Segregations Identified in Epitaxial Layer of Power MOSFETscitations
- 20233D fractures analysis and conservation assessment of wrought iron javelin through advanced non-invasive techniquescitations
- 2021Parity-preserving and magnetic field–resilient superconductivity in InSb nanowires with Sn shellscitations
- 2021Temperature effects on failure mode of double lap glass-aluminum and glass-gfrp joints with epoxy and acrylic adhesivecitations
- 2016Polymer functionalized nanocomposites for metals removal from water and wastewater: An overviewcitations
- 2014Detonation nanodiamonds tailor the structural order of PEDOT chains in conductive coating layers of hybrid nanoparticlescitations
- 2014Characterization of carbon structures produced by graphene self-assemblycitations
- 2012Silver Nanoparticles Stabilized with Thiols: A Close Look at the Local Chemistry and Chemical Structurecitations
- 2012Epitaxial-like growth of Co3O4/ZnO quasi-1D nanocompositescitations
- 2012Conducting polymers/nanodiamond composites: preparation and applications of unconventional nanofibers and fibril-like structures
- 2012High ordered biomineralization induced by carbon nanoparticles in the sea urchin Paracentrotus lividuscitations
Places of action
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document
A Multiscale and Multimodal Correlative Microscopy Workflow to Characterize Copper Segregations Identified in Epitaxial Layer of Power MOSFETs
Abstract
<jats:title>Abstract</jats:title><jats:p>Power MOSFETs are electronic devices that are commonly used as switches or amplifiers in power electronics applications such as motor control, audio amplifiers, power supplies and illumination systems. During the fabrication process, impurities such as copper can become incorporated into the device structure, giving rise to defects in crystal lattice and creating localized areas of high resistance or conductivity. In this work we present a multiscale and multimodal correlative microscopy workflow for the characterization of copper inclusions found in the epitaxial layer in power MOSFETs combining Light Microscopy (LM), non-destructive 3D X-ray Microscopy (XRM), Focused-Ion Beam Scanning Electron Microscopy (FIB-SEM) tomography coupled with Energy Dispersive X-ray Spectroscopy (EDX), and Transmission Electron Microscopy (TEM) coupled with Electron Energy Loss Spectroscopy (EELS). Thanks to this approach of correlating 2D and 3D morphological insights with chemical information, a comprehensive and multiscale understanding of copper segregations distribution and effects at the structural level of the power MOSFETs can be achieved.</jats:p>