Materials Map

Discover the materials research landscape. Find experts, partners, networks.

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The Materials Map is an open tool for improving networking and interdisciplinary exchange within materials research. It enables cross-database search for cooperation and network partners and discovering of the research landscape.

The dashboard provides detailed information about the selected scientist, e.g. publications. The dashboard can be filtered and shows the relationship to co-authors in different diagrams. In addition, a link is provided to find contact information.

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The Materials Map is still under development. In its current state, it is only based on one single data source and, thus, incomplete and contains duplicates. We are working on incorporating new open data sources like ORCID to improve the quality and the timeliness of our data. We will update Materials Map as soon as possible and kindly ask for your patience.

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in Cooperation with on an Cooperation-Score of 37%

Topics

Publications (25/25 displayed)

  • 2022Large Field of View and Artifact-Free Plan View TEM Specimen Preparation by Post-FIB Ar Millingcitations
  • 2022A CPFEM based theoretical analysis of strains resolved by the microstructural feature tracking method2citations
  • 2022A CPFEM based theoretical analysis of strains resolved by the microstructural feature tracking method2citations
  • 2021A phase-field investigation of recrystallization boundary migration into heterogeneous deformation energy fields: Effects of dislocation boundary sharpness4citations
  • 2020Cutting-Edge Sample Preparation from FIB to Ar Concentrated Ion Beam Milling of Advanced Semiconductor Devicescitations
  • 2019Microscopic nonequilibrium energy transfer dynamics in a photoexcited metal/insulator heterostructure22citations
  • 2019Addition of the lewis acid Zn(C6 F5 )2 enables organic transistors with a maximum hole mobility in excess of 20 cm2 V-1 s-174citations
  • 2018Gate-controlled quantum dots and superconductivity in planar germanium134citations
  • 2018On the effect of confinement on the structure and properties of small-molecular organic semiconductors21citations
  • 2017A novel type of Co–Ti–Cr-base γ/γ<sup>′</sup> superalloys with low mass density117citations
  • 2016Vertical phase separation in small molecule: polymer blend organic thin film transistors can be dynamically controlled107citations
  • 2016Confinement effects on the crystalline features of poly(9,9-dioctylfluorene)13citations
  • 2016Elemental partitioning, lattice misfit and creep behaviour of Cr containing gamma ' strengthened Co base superalloys83citations
  • 2012Triple yielding and deformation mechanisms in metastable Cu <inf>47.5</inf>Zr <inf>47.5</inf>Al <inf>5</inf> composites139citations
  • 2011The influence of in situ formed precipitates on the plasticity of Fe-Nb-B-Cu bulk metallic glasses13citations
  • 2011<inf>96</inf>Nb<inf>4</inf> metallic glasses with small Cu additions17citations
  • 2011Nanocomposite characterization on multiple length scales using microSAXS8citations
  • 2011(Fe(0.5)Co(0.5))(0.75)B(0.20)Si(0.05) (96)Nb(4) Metallic Glasses with Small Cu Additions17citations
  • 2011Strategy for pinpointing the formation of B2 CuZr in metastable CuZr-based shape memory alloys138citations
  • 2010Thermal stability and magnetic properties of FeCoBSiNb bulk metallic glasses54citations
  • 2010Mechanical properties of rapidly solidified Fe-Al-B ternary alloys9citations
  • 2009Crystallization and magnetic properties of [(Fe,Co)<inf>0.75</inf>Si <inf>0.05</inf>B<inf>0.20</inf>]<inf>94</inf>Nb<inf>6</inf> metallic glasses19citations
  • 2009Effect of minor Cu addition on phase evolution and magnetic properties of {[(Fe<inf>0.5</inf>Co<inf>0.5</inf>)<inf>0.75</inf>Si<inf>0.05</inf>B <inf>0.20</inf>]<inf>0.96</inf>Nb<inf>0.04</inf>}<inf>100-x</inf> Cu<inf>x</inf> alloys19citations
  • 2006ZnCdSe-ZnSe cladded quantum dots using photoassisted microwave plasma enhanced metalorganic chemical vapor deposition for lasers and electroluminescent phosphorscitations
  • 2006ZnCdSe-ZnSe cladded quantum dots using Photoassisted Microwave Plasma (PMP) enhanced metalorganic chemical vapor deposition for lasers and electroluminescent phosphorscitations

Places of action

Chart of shared publication
Nowakowski, Pawel
2 / 9 shared
Fischione, P. E.
2 / 6 shared
Bonifacio, C. S.
2 / 4 shared
Ray, M. L.
2 / 4 shared
Kobayashi, M.
2 / 8 shared
Juul Jensen, D.
2 / 10 shared
Oddershede, J.
1 / 6 shared
Zhang, Y.
5 / 149 shared
Quey, R.
2 / 7 shared
Jensen, D. Juul
1 / 9 shared
Oddershede, Jette
1 / 41 shared
Moelans, N.
1 / 29 shared
Yadav, V.
1 / 4 shared
Downing, C.
1 / 8 shared
Schmitz-Antoniak, C.
1 / 1 shared
Zhou, P.
1 / 3 shared
Wang, X. J.
1 / 3 shared
Gruner, M. E.
1 / 5 shared
Weathersby, S.
1 / 1 shared
Salamon, S.
1 / 1 shared
Wende, H.
1 / 5 shared
Shen, X.
1 / 7 shared
Park, S.
1 / 18 shared
Sokolowski-Tinten, K.
1 / 4 shared
Ollefs, K.
1 / 2 shared
Yang, J.
1 / 37 shared
Bovensiepen, U.
1 / 3 shared
Pentcheva, R.
1 / 4 shared
Rothenbach, N.
1 / 1 shared
Eschenlohr, A.
1 / 4 shared
Mo, M.
1 / 3 shared
Panidi, J.
1 / 5 shared
Fei, Z.
1 / 10 shared
Emwas, A-H
1 / 1 shared
Tsetseris, L.
1 / 6 shared
Faber, H.
1 / 7 shared
Paterson, Af
1 / 3 shared
Anjum, Dh
1 / 1 shared
Basu, A.
1 / 5 shared
Niazi, Mr
2 / 2 shared
Anthopoulos, Td
2 / 21 shared
Heeney, M.
1 / 29 shared
Capellini, G.
1 / 13 shared
Tagliaferri, M. L. V.
1 / 1 shared
Franke, D. P.
1 / 1 shared
Kouwenhoven, M.
1 / 1 shared
Scappucci, G.
1 / 6 shared
Sammak, A.
1 / 4 shared
Veldhorst, M.
1 / 1 shared
Virgilio, M.
1 / 5 shared
Yeoh, L. A.
1 / 2 shared
Hendrickx, N. W.
1 / 2 shared
Sabbagh, D.
1 / 1 shared
Smilgies, D. M.
2 / 2 shared
Rumbles, G.
1 / 4 shared
Stingelin, N.
2 / 16 shared
Amassian, A.
2 / 7 shared
Nogales, A.
2 / 8 shared
Martín, J.
1 / 2 shared
Silva, C.
1 / 69 shared
Dyson, M.
1 / 1 shared
Reid, O. G.
1 / 1 shared
Göken, Mathias
2 / 350 shared
Zenk, C. H.
2 / 28 shared
Neumeier, Steffen
2 / 118 shared
Rinaldi, F.
1 / 1 shared
Raabe, D.
2 / 79 shared
Povstugar, I.
2 / 12 shared
Li, Eq
1 / 1 shared
Abdelsamie, M.
1 / 4 shared
Zhao, K.
1 / 1 shared
Yan, B.
1 / 3 shared
Thoroddsen, St
1 / 1 shared
Wodo, O.
1 / 1 shared
Anthony, Je
1 / 2 shared
Ren, D.
1 / 1 shared
Khan, Hu
1 / 1 shared
Payne, Mm
1 / 1 shared
Ganapathysubramanian, B.
1 / 1 shared
Smith, J.
1 / 17 shared
Yu, L.
1 / 14 shared
Hu, H.
1 / 6 shared
-M., Smilgies D.
1 / 1 shared
Martin, J.
1 / 29 shared
D., Scaccabarozzi A.
1 / 10 shared
Neumeier, S.
1 / 63 shared
Choi, P. -P.
1 / 1 shared
Choi, P.-P.
1 / 10 shared
Hoelzel, M.
1 / 13 shared
Dolotko, O.
1 / 5 shared
Goeken, M.
1 / 22 shared
Song, K. K.
2 / 12 shared
Pauly, S.
2 / 80 shared
Eckert, Jürgen
8 / 1035 shared
Gorantla, S.
1 / 13 shared
Gemming, T.
1 / 91 shared
Narayanan, N.
1 / 1 shared
Kühn, U.
3 / 173 shared
Hyang Kim, D.
1 / 1 shared
Mattern, N.
1 / 139 shared
Man Park, J.
1 / 1 shared
Stoica, M.
8 / 140 shared
Roth, S.
3 / 94 shared
Vaughan, G.
3 / 33 shared
Yavari, A. R.
3 / 66 shared
Cornaby, S.
1 / 1 shared
Kamperman, M. M. G.
1 / 7 shared
Eckert, J.
1 / 70 shared
Gargarella, P.
1 / 26 shared
Barekar, N. S.
1 / 3 shared
Romera, D. R.
1 / 1 shared
Van Steenberge, N.
1 / 6 shared
Zhang, T.
1 / 15 shared
Pang, S.
1 / 1 shared
Park, J. M.
1 / 18 shared
Kumar, S.
1 / 105 shared
Ram, S.
1 / 19 shared
Huang, W.
2 / 9 shared
Ayers, J.
2 / 2 shared
Jain, F.
2 / 2 shared
Papadimitrakopoulos, F.
2 / 2 shared
Rodriguez, A.
2 / 6 shared
Vitti, L.
1 / 1 shared
Yarlagadda, Prasad Kdv
2 / 50 shared
Chart of publication period
2022
2021
2020
2019
2018
2017
2016
2012
2011
2010
2009
2006

Co-Authors (by relevance)

  • Nowakowski, Pawel
  • Fischione, P. E.
  • Bonifacio, C. S.
  • Ray, M. L.
  • Kobayashi, M.
  • Juul Jensen, D.
  • Oddershede, J.
  • Zhang, Y.
  • Quey, R.
  • Jensen, D. Juul
  • Oddershede, Jette
  • Moelans, N.
  • Yadav, V.
  • Downing, C.
  • Schmitz-Antoniak, C.
  • Zhou, P.
  • Wang, X. J.
  • Gruner, M. E.
  • Weathersby, S.
  • Salamon, S.
  • Wende, H.
  • Shen, X.
  • Park, S.
  • Sokolowski-Tinten, K.
  • Ollefs, K.
  • Yang, J.
  • Bovensiepen, U.
  • Pentcheva, R.
  • Rothenbach, N.
  • Eschenlohr, A.
  • Mo, M.
  • Panidi, J.
  • Fei, Z.
  • Emwas, A-H
  • Tsetseris, L.
  • Faber, H.
  • Paterson, Af
  • Anjum, Dh
  • Basu, A.
  • Niazi, Mr
  • Anthopoulos, Td
  • Heeney, M.
  • Capellini, G.
  • Tagliaferri, M. L. V.
  • Franke, D. P.
  • Kouwenhoven, M.
  • Scappucci, G.
  • Sammak, A.
  • Veldhorst, M.
  • Virgilio, M.
  • Yeoh, L. A.
  • Hendrickx, N. W.
  • Sabbagh, D.
  • Smilgies, D. M.
  • Rumbles, G.
  • Stingelin, N.
  • Amassian, A.
  • Nogales, A.
  • Martín, J.
  • Silva, C.
  • Dyson, M.
  • Reid, O. G.
  • Göken, Mathias
  • Zenk, C. H.
  • Neumeier, Steffen
  • Rinaldi, F.
  • Raabe, D.
  • Povstugar, I.
  • Li, Eq
  • Abdelsamie, M.
  • Zhao, K.
  • Yan, B.
  • Thoroddsen, St
  • Wodo, O.
  • Anthony, Je
  • Ren, D.
  • Khan, Hu
  • Payne, Mm
  • Ganapathysubramanian, B.
  • Smith, J.
  • Yu, L.
  • Hu, H.
  • -M., Smilgies D.
  • Martin, J.
  • D., Scaccabarozzi A.
  • Neumeier, S.
  • Choi, P. -P.
  • Choi, P.-P.
  • Hoelzel, M.
  • Dolotko, O.
  • Goeken, M.
  • Song, K. K.
  • Pauly, S.
  • Eckert, Jürgen
  • Gorantla, S.
  • Gemming, T.
  • Narayanan, N.
  • Kühn, U.
  • Hyang Kim, D.
  • Mattern, N.
  • Man Park, J.
  • Stoica, M.
  • Roth, S.
  • Vaughan, G.
  • Yavari, A. R.
  • Cornaby, S.
  • Kamperman, M. M. G.
  • Eckert, J.
  • Gargarella, P.
  • Barekar, N. S.
  • Romera, D. R.
  • Van Steenberge, N.
  • Zhang, T.
  • Pang, S.
  • Park, J. M.
  • Kumar, S.
  • Ram, S.
  • Huang, W.
  • Ayers, J.
  • Jain, F.
  • Papadimitrakopoulos, F.
  • Rodriguez, A.
  • Vitti, L.
  • Yarlagadda, Prasad Kdv
OrganizationsLocationPeople

article

Cutting-Edge Sample Preparation from FIB to Ar Concentrated Ion Beam Milling of Advanced Semiconductor Devices

  • Downing, C.
  • Nowakowski, Pawel
  • Li, R.
  • Fischione, P. E.
  • Bonifacio, C. S.
  • Ray, M. L.
Abstract

<jats:title>Abstract</jats:title><jats:p>Fast and accurate examination from the bulk to the specific area of the defect in advanced semiconductor devices is critical in failure analysis. This work presents the use of Ar ion milling methods in combination with Ga focused ion beam (FIB) milling as a cutting-edge sample preparation technique from the bulk to specific areas by FIB lift-out without sample-preparation-induced artifacts. The result is an accurately delayered sample from which electron-transparent TEM specimens of less than 15 nm are obtained.</jats:p>

Topics
  • impedance spectroscopy
  • grinding
  • semiconductor
  • laser emission spectroscopy
  • milling
  • focused ion beam
  • transmission electron microscopy
  • defect