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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Motz, Christian
Saarland University
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (5/5 displayed)
- 2022Determination of grain size distribution of prior austenite grains through a combination of a modified contrasting method and machine learningcitations
- 2018Local Characterization of Precipitation and Correlation with the Prior Austenitic Microstructure in Nb-Ti-Microalloyed Steel by SEM and AFM Methodscitations
- 2015How to produce a desired bimodal microstructure for optimized mechanical properties: Investigation of the mechanisms of abnormal grain growth in pulsed electro-deposited nickelcitations
- 2012Sample Preparation by Metallography and Focused Ion Beam for Nanomechanical Testingcitations
- 2009Overview on established and novel FIB based miniaturized mechanical testing using in-situ SEMcitations
Places of action
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article
Overview on established and novel FIB based miniaturized mechanical testing using in-situ SEM
Abstract
<jats:title>Abstract</jats:title><jats:p>Probing mechanical properties in the micrometer regime is of current interest in materials science. A focused ion beam microscope was employed to fabricate miniaturized specimens, while an indenter installed in a scanning electron microscope was utilized to actuate the samples and record the load and displacement data during the deformation. Examples for miniaturized compression, tension, bending, as well as newly developed bending fatigue and bending fracture experiments are presented, demonstrating the unique flexibility of in-situ mechanical testing in the scanning electron microscope at small length scales.</jats:p>