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Naji, M. |
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Motta, Antonella |
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Aletan, Dirar |
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Mohamed, Tarek |
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Ertürk, Emre |
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Taccardi, Nicola |
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Kononenko, Denys |
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Petrov, R. H. | Madrid |
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Alshaaer, Mazen | Brussels |
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Bih, L. |
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Casati, R. |
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Muller, Hermance |
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Kočí, Jan | Prague |
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Šuljagić, Marija |
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Kalteremidou, Kalliopi-Artemi | Brussels |
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Azam, Siraj |
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Ospanova, Alyiya |
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Blanpain, Bart |
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Ali, M. A. |
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Popa, V. |
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Rančić, M. |
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Ollier, Nadège |
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Azevedo, Nuno Monteiro |
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Landes, Michael |
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Rignanese, Gian-Marco |
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Caratelli, Diego
Eindhoven University of Technology
in Cooperation with on an Cooperation-Score of 37%
Topics
Publications (9/9 displayed)
- 2023An Open Hemispherical Resonant Cavity for Relative Permittivity Measurements of Fluid and Solid Materials at mm-Wave Frequenciescitations
- 2022Relative Permittivity Measurements With SIW Resonant Cavities at mm- Wave Frequenciescitations
- 2022A Wide-Scanning Metasurface Antenna Array for 5G Millimeter-Wave Communication Devicescitations
- 2022FDTD-Based Electromagnetic Modeling of Dielectric Materials with Fractional Dispersive Responsecitations
- 2017Fractional–Calculus–Based FDTD Algorithm for Ultra–Wideband Electromagnetic Pulse Propagation in Complex Layered Havriliak–Negami Mediacitations
- 2016Fractional calculus-based modeling of electromagnetic field propagation in arbitrary biological tissuecitations
- 2016Fractional-calculus-based FDTD algorithm for ultrawideband electromagnetic characterization of arbitrary dispersive dielectric materialscitations
- 2015Fractional-calculus-based FDTD method for solving pulse propagation problemscitations
- 2011New Approaches of Nanocomposite Materials for Electromagnetic Sensors and Roboticscitations
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document
Relative Permittivity Measurements With SIW Resonant Cavities at mm- Wave Frequencies
Abstract
<p>In this paper an effective though simple method to accurately characterize dielectric substrate materials at mm-wave frequencies is presented. The method is based on the use of a resonant cavity in SIW technology realized in a substrate made out of the material to characterize. Based on the measured resonant frequency, it is then possible to extract the electrical properties of the material exclusively from the geometry of the cavity. The SIW cavity is fed by two grounded coplanar waveguides to reduce the loading effect of the transmission lines and to avoid errors in the estimations of relative permittivity. The proposed cavity provides a solution for material characterization for emerging 5G-and-beyond applications operating at high frequencies. Measurements have been performed in the frequency range from 10 GHz to 30 GHz, but the design is scalable to lower or higher frequency ranges, if within the possibilities of the manufacturing process of the cavity.</p>